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http://hdl.handle.net/1942/23327Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | CAROLUS, Jorne | - |
| dc.contributor.author | DE CEUNINCK, Ward | - |
| dc.contributor.author | DAENEN, Michael | - |
| dc.date.accessioned | 2017-03-10T08:46:16Z | - |
| dc.date.available | 2017-03-10T08:46:16Z | - |
| dc.date.issued | 2017 | - |
| dc.identifier.citation | IRPS'17: Proceedings of 55th IEEE International Reliability Physics Symposium, 2017, IEEE, | - |
| dc.identifier.isbn | 9781509066414 | - |
| dc.identifier.issn | 1541-7026 | - |
| dc.identifier.uri | http://hdl.handle.net/1942/23327 | - |
| dc.description.abstract | Potential-induced degradation (PID) of photovoltaic (PV) modules gets a lot of attention since 2010 when Solon published their findings about a degradation mechanism in their PV modules caused by high potential differences between the solar cell and the grounded frame. Module level efficiency drops of 30% and more caused by PID have been reported. A stress test for PID according to IEC 62804 and a recovery test in the same conditions were conducted on a set of 49 commercially available PV modules. In this paper we report the irreversibility of highly affected (i.e. over 85% PID) PV modules. From this point of view, it is important to detect and recover PID before the point of no return. Furthermore, the impact of PID on the different parameters of a PV module and their relevance in order to detect PID in the field are reported. | - |
| dc.description.sponsorship | The authors would like to acknowledge the support of the European Union, the European Regional Development Fund ERDF, Flanders Innovation & Entrepreneurship and the Province of Limburg. Moreover, the authors would like to thank pidbull nv for both their financial and logistic support. | - |
| dc.language.iso | en | - |
| dc.publisher | IEEE | - |
| dc.relation.ispartofseries | International Reliability Physics Symposium | - |
| dc.subject.other | High Voltage Stress (HVS); photovoltaic (PV) modules; Potential-Induced Degradation (PID); reliability; Test Campaign | - |
| dc.title | Irreversible damage at high levels of potential-induced degradation on photovoltaic modules | - |
| dc.type | Proceedings Paper | - |
| local.bibliographicCitation.conferencedate | 02-06/04/2017 | - |
| local.bibliographicCitation.conferencename | 2017 IEEE International Reliability Physics Symposium (IRPS) | - |
| local.bibliographicCitation.conferenceplace | Monterey (CA), USA | - |
| dc.identifier.epage | 2F-5.6 | - |
| dc.identifier.spage | 2F-5.1 | - |
| local.format.pages | 6 | - |
| local.bibliographicCitation.jcat | C1 | - |
| dc.description.notes | Carolus, J (reprint author), Hasselt Univ, Martelarenlaan 42, B-3500 Hasselt, Belgium. jorne.carolus@uhasselt.be | - |
| local.publisher.place | New York (NY), USA | - |
| dc.relation.references | [1] S. Pingel, O. Frank, M. Winkler, S. Daryan, T. Geipel, H. Hoehne, and J. Berghold, “POTENTIAL INDUCED DEGRADATION OF SOLAR CELLS AND PANELS.” [2] J. Berghold, O. Frank, H. Hoehne, S. Pingel, B. Richardson, and M. Winkler, “Potential Induced Degradation of solar cells and panels.” [3] S. Koch, C. Seidel, P. Grunow, S. Krauter, and M. Schoppa, “Polarization effects and test for crystalline silicon cells,” in Photovoltaik Institut Berlin, 2011, pp. 1–6. [4] J. Berghold, S. Koch, S. Pingel, S. Janke, A. Ukar, P. Grunow, and T. Shioda, “PID: from material properties to outdoor performance and quality control counter measures,” 2015, p. 95630A. [5] R. Swanson, M. Cudzinovic, D. DeCeuster, V. Desai, J. Jürgens, N. Kaminar, W. Mulligan, L. Rodrigues-Barbarosa, D. Rose, D. Smith, A. Terao, and K. Wilson, “The surface polarization effect in high-efficiency silicon solar cells,” 2005. [6] V. Naumann, D. Lausch, A. Hähnel, J. Bauer, O. Breitenstein, A. Graff, M. Werner, S. Swatek, S. Großer, J. Bagdahn, and C. Hagendorf, “Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells,” Sol. Energy Mater. Sol. Cells, vol. 120, pp. 383–389, 2014. [7] V. Naumann, D. Lausch, S. Großer, M. Werner, S. Swatek, C. Hagendorf, and J. Bagdahn, “Microstructural Analysis of Crystal Defects Leading to Potential-Induced Degradation (PID) of Si Solar Cells,” Energy Procedia, vol. 33, pp. 76–83, 2013. [8] V. Naumann, C. Hagendorf, S. Grosser, M. Werner, and J. Bagdahn, “Micro Structural Root Cause Analysis of Potential Induced Degradation in c-Si Solar Cells,” Energy Procedia, vol. 27, pp. 1–6, 2012. [9] J. Bauer, V. Naumann, S. Großer, C. Hagendorf, M. Schütze, and O. Breitenstein, “On the mechanism of potential-induced degradation in crystalline silicon solar cells,” Phys. status solidi - Rapid Res. Lett., vol. 6, no. 8, pp. 331–333, Aug. 2012. [10] S. Koch, D. Nieschalk, J. Berghold, S. Wendlandt, S. Krauter, and P. Grunow, “Potential Induced Degradation Effects on Crystalline Silicon Cells with Various Antireflective Coatings,” pp. 1985–1990, 2012. [11] P. Hacke, K. Terwilliger, R. Smith, S. Glick, J. Pankow, M. Kempe, S. Kurtz, I. Bennett, and M. Kloos, “System Voltage Potential- Induced Degradation Mechanisms in PV Modules and Methods for Test Preprint,” 2011. [12] D. Lausch, V. Naumann, A. Graff, A. Hähnel, O. Breitenstein, C. Hagendorf, and J. Bagdahn, “Sodium Outdiffusion from Stacking Faults as Root Cause for the Recovery Process of Potential-induced Degradation (PID),” Energy Procedia, vol. 55, pp. 486–493, 2014. [13] A. Masuda;, Y. Hara;, and S. Jonai, “Consideration on Na diffusion and recovery phenomena in potential-induced degradation for crystalline Si photovoltaic modules,” Jpn. J. Appl. Phys., vol. 55, no. 2S, p. 02BF10, Feb. 2016. [14] M. Koehl and S. Hoffmann, “Impact of rain and soiling on potential induced degradation,” Prog. Photovoltaics Res. Appl., vol. 24, no. 10, pp. 1304–1309, Oct. 2016. [15] F. Martínez-Moreno, E. Lorenzo, and J. Muñoz, “ON-SITE TESTS FOR THE DETECTION OF POTENTIAL INDUCED DEGRADATION IN MODULES.” [16] S. Dietrich, J. Froebel, M. Ebert, and J. Bagdahn, “EXPERIENCES ON PID TESTING OF PV MODULES IN 2012,” 2013. [17] N. Riedel, L. Pratt, E. Moss, and M. Yamasaki, “600 Hour Potential Induced Degradation (PID) Testing on Silicon, CIGS and HIT Modules,” 2015. | - |
| local.type.refereed | Refereed | - |
| local.type.specified | Proceedings Paper | - |
| dc.identifier.doi | 10.1109/IRPS.2017.7936275 | - |
| dc.identifier.isi | 000416068500023 | - |
| local.bibliographicCitation.btitle | IRPS'17: Proceedings of 55th IEEE International Reliability Physics Symposium, 2017 | - |
| item.validation | ecoom 2018 | - |
| item.accessRights | Restricted Access | - |
| item.fullcitation | CAROLUS, Jorne; DE CEUNINCK, Ward & DAENEN, Michael (2017) Irreversible damage at high levels of potential-induced degradation on photovoltaic modules. In: IRPS'17: Proceedings of 55th IEEE International Reliability Physics Symposium, 2017, IEEE,. | - |
| item.contributor | CAROLUS, Jorne | - |
| item.contributor | DE CEUNINCK, Ward | - |
| item.contributor | DAENEN, Michael | - |
| item.fulltext | With Fulltext | - |
| Appears in Collections: | Research publications | |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| PID1191560.pdf Restricted Access | Peer-reviewed author version | 492.8 kB | Adobe PDF | View/Open Request a copy |
| document.pdf Restricted Access | Published version | 556.46 kB | Adobe PDF | View/Open Request a copy |
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