STALS, Lambert

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STALS, Lambert
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lambert.stals@uhasselt.be
 
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Type:  Proceedings Paper

Results 1-9 of 9 (Search time: 0.013 seconds).

Issue DateTitleContributor(s)TypeCat.
12001Synthesis and characterisation of CVD diamond filmsMEYKENS, Kristien; NESLADEK, Milos; HAENEN, Ken; STALS, LambertProceedings PaperC2
21999Optical spectroscopic study of n-type diamondNESLADEK, Milos; MEYKENS, Kristien; HAENEN, Ken; STALS, Lambert; KOIZUMI, Satoshi; TERAJI, TokuyukiProceedings Paper
31998New approach for the measurement of residual macroscopic stresses on highly preferentially oriented thin films using X-ray diffractionMEERT, Bart; QUAEYHAEGENS, Carl; KNUYT, Gilbert; JANSSEN, Herman; STALS, LambertProceedings Paper
41997CVD diamond coated WC-Co tools: an adhesion studyNESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, Lambert; van Stappen, M.Proceedings Paper
51997Diamond films for electronic applicationsMEYKENS, Kristien; NESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, LambertProceedings Paper
61996Electrical characterisation and reliability studies of thick film gas sensor structures.CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert; DE SCHEPPER, LucProceedings Paper
71996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
81996On the deposition and characterization of thin SnO2 filmsCZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J.; Huyberechts, G.Proceedings Paper
91994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper