DE CEUNINCK, Ward

Email Alert RSS Feed

Profile

Full Name
DE CEUNINCK, Ward
Email
ward.deceuninck@uhasselt.be
 
Loading... 5 0 5 0 false
Loading... 6 0 5 0 false

Publications

Refined By:
Author:  D'HAEN, Jan

Results 1-20 of 25 (Search time: 0.015 seconds).

show all
Issue DateTitleContributor(s)TypeCat.
12018Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modulesNIVELLE, Philippe; BORGERS, Tom; Voroshazi, Eszter; POORTMANS, Jef; D'HAEN, Jan; DE CEUNINCK, Ward; DAENEN, MichaelConference MaterialC2
22018Micro-patterned molecularly imprinted polymer structures on functionalized diamond-coated substrates for testosterone detectionKELLENS, Evelien; BOVE, Hannelore; VANDENRYT, Thijs; LAMBRICHTS, Jeroen; Dekens, Jolien; DRIJKONINGEN, Sien; D'HAEN, Jan; DE CEUNINCK, Ward; THOELEN, Ronald; JUNKERS, Tanja; HAENEN, Ken; ETHIRAJAN, AnithaJournal ContributionA1
32018Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modulesNIVELLE, Philippe; BORGERS, Tom; Voroshazi, Eszter; POORTMANS, Jef; D'HAEN, Jan; DE CEUNINCK, Ward; DAENEN, MichaelProceedings PaperC1
42014Rapid fabrication of micron-sized CVD-diamond structures by microfluidic contact printingVANDENRYT, Thijs; GRIETEN, Lars; JANSSENS, Stoffel; VAN GRINSVEN, Bart; HAENEN, Ken; RUTTENS, Bart; D'HAEN, Jan; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardJournal ContributionA1
52008Increasing the mean grain size in copper films and featuresVANSTREELS, Kris; Brongersma, S.H.; Tokei, Zs.; Carbonell, L; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, MarcJournal ContributionA1
62007Microstructural evolution of cu interconnect under AC, pulsed DC and DC current stressBIESEMANS, Leen; VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcProceedings PaperC1
72007High sputter bias super secondary grain growth initiation (In structures)VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DEMUYNCK, Steven; DE CEUNINCK, Ward; CALUWAERTS, Rudi; D'OLIESLAEGER, MarcProceedings PaperC1
82006Super secondary grain growth initiation in electroplated copperVANSTREELS, Kris; Brongersma, SH; Demuynck, S; Carbonell, L; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KProceedings PaperC1
92005A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenJournal ContributionA1
102004Super secondary grain growth in the barrier/seedlayer systemVANSTREELS, Kris; Brongersma, S.H.; Demuynck, S.; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KarenProceedings PaperC1
112004A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenProceedings PaperC1
122004MTF test system with AC based dynamic joule correction for electromigration tests on interconnectsBIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcJournal ContributionA1
132003Copper deposition and subsequent grain structure evolution in narrow linesBrongersma, SH; D'HAEN, Jan; VANSTREELS, Kris; DE CEUNINCK, Ward; Vervoort, I; Maex, KProceedings PaperC1
142003A new method for the analysis of high-resolution SILC dataARESU, Stefano; DE CEUNINCK, Ward; KNUYT, Gilbert; MERTENS, Johan; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
152002Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyPETERSEN, Rainer; DE CEUNINCK, Ward; D'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Vendier, O; Blanck, HJournal ContributionA1
162002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
172002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
182000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
192000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
201999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
show all