DE CEUNINCK, Ward

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DE CEUNINCK, Ward
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ward.deceuninck@uhasselt.be
 
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Type:  Proceedings Paper

Results 1-20 of 24 (Search time: 0.006 seconds).

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Issue DateTitleContributor(s)TypeCat.
12021Reliability Analysis Framework for a Grid-Tied PV-Battery System: Influence of PV and Battery Degradation on Reliability of Power Electronic SystemsALAVI, Omid; VAN DE SANDE, Wieland; VAN CAPPELLEN, Leander; DE CEUNINCK, Ward; DAENEN, Michael; Van De Sande, W.; Van Cappellen, L.; DAENEN, MarcProceedings PaperC2
22020Influence of PV and Battery Degradation on Residential Solar Panel SystemsALAVI, Omid; DE CEUNINCK, Ward; MEURIS, Marc; DAENEN, MichaelProceedings PaperC1
32020Economic Study of Battery Profitability in Residential Solar Panel Systems: A Case Study of BelgiumALAVI, Omid; Despeghel, Jolien; DE CEUNINCK, Ward; MEURIS, Marc; Driesen, Johan; DAENEN, MichaelProceedings PaperC1
42018Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modulesNIVELLE, Philippe; BORGERS, Tom; Voroshazi, Eszter; POORTMANS, Jef; D'HAEN, Jan; DE CEUNINCK, Ward; DAENEN, MichaelProceedings PaperC1
52017Voltage dependence of potential-induced degradation and recovery on photovoltaic one-cell laminatesCAROLUS, Jorne; GOVAERTS, Jonathan; Voroshazi, Eszter; DE CEUNINCK, Ward; DAENEN, MichaelProceedings PaperC2
62017Irreversible damage at high levels of potential-induced degradation on photovoltaic modulesCAROLUS, Jorne; DE CEUNINCK, Ward; DAENEN, MichaelProceedings PaperC1
72013Cell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assaysDUCHATEAU, Stijn; BROEDERS, Jeroen; CROUX, Dieter; RIGO, Jean-Michel; WAGNER, Patrick; THOELEN, Ronald; DE CEUNINCK, WardProceedings PaperC1
82012Embedded unit for point-of-care impedance based biosensor readoutBROEDERS, Jeroen; CROUX, Dieter; WEUSTENRAED, Ans; CLEIJ, Thomas; WAGNER, Patrick; DE CEUNINCK, Ward; Vanaken, Wouter; DUCHATEAU, Stijn; THOELEN, RonaldProceedings PaperC1
92011Optimization of a boron doped nanocrystalline diamond temperature regulator for sensing applicationsCLUKERS, Tim; VAN GRINSVEN, Bart; VANDENRYT, Thijs; JANSSENS, Stoffel; WAGNER, Patrick; DE CEUNINCK, Ward; THOELEN, Ronald; DAENEN, Michael; HAENEN, KenProceedings PaperC1
102008The influence of different surface terminations on electrical transport and emission properties for freestanding single crystalline (100) CVD diamond samplesDEFERME, Wim; BOGDAN, Anna; HAENEN, Ken; DE CEUNINCK, Ward; Flipse, K.; NESLADEK, MilosProceedings PaperC1
112007Microstructural evolution of cu interconnect under AC, pulsed DC and DC current stressBIESEMANS, Leen; VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcProceedings PaperC1
122007High sputter bias super secondary grain growth initiation (In structures)VANSTREELS, Kris; BRONGERSMA, Sywert; D'HAEN, Jan; DEMUYNCK, Steven; DE CEUNINCK, Ward; CALUWAERTS, Rudi; D'OLIESLAEGER, MarcProceedings PaperC1
132007Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.Proceedings PaperC1
142007Electrical transport and defect spectroscopy of free standing single crystal CVD diamond prepared from methane rich mixturesBOGDAN, Andrey; BOGDAN, Anna; DE CEUNINCK, Ward; HAENEN, Ken; NESLADEK, MilosProceedings PaperC1
152006Super secondary grain growth initiation in electroplated copperVANSTREELS, Kris; Brongersma, SH; Demuynck, S; Carbonell, L; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KProceedings PaperC1
162004Super secondary grain growth in the barrier/seedlayer systemVANSTREELS, Kris; Brongersma, S.H.; Demuynck, S.; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; Maex, KarenProceedings PaperC1
172004A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structureVANSTREELS, Kris; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; D'HAEN, Jan; Maex, KarenProceedings PaperC1
182003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.Proceedings PaperC2
192003Copper deposition and subsequent grain structure evolution in narrow linesBrongersma, SH; D'HAEN, Jan; VANSTREELS, Kris; DE CEUNINCK, Ward; Vervoort, I; Maex, KProceedings PaperC1
202000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1
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