LEKENS, Geert

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LEKENS, Geert
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geert.lekens@uhasselt.be
 
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Author:  Beyne, E

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12003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, EJournal ContributionA1