LEKENS, Geert

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Full Name
LEKENS, Geert
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geert.lekens@uhasselt.be
 
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Type:  Journal Contribution

Results 1-6 of 6 (Search time: 0.003 seconds).

Issue DateTitleContributor(s)TypeCat.
12011In situ synchrotron based x-ray fluorescence and scattering measurements during atomic layer deposition : Initial growth of HfO2 on Si and Ge substratesDevloo-Casier, Kilian; Dendooven, Jolien; Ludwig, K.F.; LEKENS, Geert; D'HAEN, Jan; Detavernier, ChristopheJournal ContributionA1
22007Lifetime modeling of intrinsic gate oxide breakdown at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, JanJournal ContributionA1
32005Failure mechanisms and qualification testing of passive componentsPost, H.A.; Letullier, P.; Briolat, T.; Humke, R.; Schuhmann, R.; Saarinen, K.; Werner, W.; Ousten, Y.; LEKENS, Geert; Dehbi, A.; Wondrak, W.Journal ContributionA1
42003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, EJournal ContributionA1
51999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
61998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution