LEKENS, Geert

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LEKENS, Geert
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geert.lekens@uhasselt.be
 
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Publications

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Internal UHasselt:  D'HAEN, Jan

Results 1-3 of 3 (Search time: 0.001 seconds).

Issue DateTitleContributor(s)TypeCat.
12011In situ synchrotron based x-ray fluorescence and scattering measurements during atomic layer deposition : Initial growth of HfO2 on Si and Ge substratesDevloo-Casier, Kilian; Dendooven, Jolien; Ludwig, K.F.; LEKENS, Geert; D'HAEN, Jan; Detavernier, ChristopheJournal ContributionA1
21999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
31998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution