LEKENS, Geert

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LEKENS, Geert

geert.lekens@uhasselt.be

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Internal UHasselt: MOONEN, Rob

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		Issue Date	Title	Contributor(s)	Type	Cat.
	1	2007	Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature	MOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.	Proceedings Paper	C1
	2	2007	Lifetime modeling of intrinsic gate oxide breakdown at high temperature	MOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, Jan	Journal Contribution	A1