DREESEN, Raf

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DREESEN, Raf

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raf.dreesen@uhasselt.be

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2 2002
2 2001
1 1999
1 1997

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Internal UHasselt

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Author: DE SCHEPPER, Luc

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		Issue Date	Title	Contributor(s)	Type	Cat.
	1	2002	Statistical aspects of the degradation of LDD nMOSFETs	ANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, Jan	Journal Contribution	A1
	2	2002	High-resolution SILC measurements of thin SiO2 ultra low voltages	ARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, Jan	Journal Contribution	A1
	3	2001	A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation	DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, G	Journal Contribution	A1
	4	2001	High-resolution in-situ study of gold electromigration: test time reduction	CROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, P	Journal Contribution	A1
	5	1999	Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.	DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, G	Journal Contribution
	6	1997	A high resolution method for measuring hot carrier degradation in matched transistor pairs	DREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.	Proceedings Paper