DREESEN, Raf

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DREESEN, Raf
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raf.dreesen@uhasselt.be
 
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Author:  DREESEN, Raf

Results 1-10 of 10 (Search time: 0.003 seconds).

Issue DateTitleContributor(s)TypeCat.
12003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.Proceedings PaperC2
22003Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesivesLEKENS, Geert; DREESEN, Raf; CROES, Kristof; Caers, J.F.J.M.; Zhao, X.J.; Wong, E.H.Proceedings PaperC2
32003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, EJournal ContributionA1
42002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
52002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
62001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
72001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
82000Modelling of the Hot-Carrier Degradation Behaviour of Submicron nMOSFETs making use of High-Resolution MeasurementsDREESEN, RafTheses and DissertationsT1
91999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution
101997A high resolution method for measuring hot carrier degradation in matched transistor pairsDREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.Proceedings Paper