DREESEN, Raf

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DREESEN, Raf

raf.dreesen@uhasselt.be

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Author: ANDRIES, Ellen

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		Issue Date	Title	Contributor(s)	Type	Cat.
	1	2002	Statistical aspects of the degradation of LDD nMOSFETs	ANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, Jan	Journal Contribution	A1
	2	2002	High-resolution SILC measurements of thin SiO2 ultra low voltages	ARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, Jan	Journal Contribution	A1