DREESEN, Raf

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Full Name
DREESEN, Raf
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raf.dreesen@uhasselt.be
 
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Date Issued:  1999

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Issue DateTitleContributor(s)TypeCat.
11999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution