DREESEN, Raf

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Full Name
DREESEN, Raf
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raf.dreesen@uhasselt.be
 
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Date Issued:  2000

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Issue DateTitleContributor(s)TypeCat.
12000Modelling of the Hot-Carrier Degradation Behaviour of Submicron nMOSFETs making use of High-Resolution MeasurementsDREESEN, RafTheses and DissertationsT1