MARTENS, Tom

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Full Name
MARTENS, Tom
Email
tom.martens@uhasselt.be
 
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Date Issued:  1999

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Issue DateTitleContributor(s)TypeCat.
11999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution