DE CLERCQ, Ben

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DE CLERCQ, Ben
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ben.declercq@uhasselt.be
 
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Author:  Volskiy, V.

Results 1-6 of 6 (Search time: 0.004 seconds).

Issue DateTitleContributor(s)TypeCat.
12014Nonlinear Superchiral Meta-Surfaces: Tuning Chirality and Disentangling Non-Reciprocity at the NanoscaleValev, V. K.; Baumberg, J.J.; DE CLERCQ, Ben; Braz, N.; Zheng, X.; Osley, E. J.; Vandendriessche, S.; Hojeij, M.; Blejean, C.; Mertens, Johan; Biris, C. G.; Volskiy, V.; AMELOOT, Marcel; Ekinci, Y.; Vandenbosch, G. A. E.; Warburton, P. A.; Moshchalkov, V. V.; Panoiu, N. C.; Verbiest, T.Journal ContributionA1
22012Distributing the Optical Near-Field for Efficient Field-Enhancements in NanostructuresValev, V. K.; DE CLERCQ, Ben; Biris, C. G.; Zheng, X.; Vandendriessche, S.; Hojeij, M.; Denkova, D.; Jeyaram, Y.; Panoiu, N. C.; Ekinci, Y.; Silhanek, A. V.; Volskiy, V.; Vandenbosch, G. A. E.; AMELOOT, Marcel; Moshchalkov, V. V.; Verbiest, T.Journal ContributionA1
32012Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterialsValev, V.K.; DE CLERCQ, Ben; Zheng, X.; Biris, C.G.; Panoiu, N.C.; Silhanek, A.V.; Volskiy, V.; Aktsipetrov, Oleg A.; Vandenbosch, G.A.E.; AMELOOT, Marcel; Moshchalkov, V.V.; Verbiest, T.Proceedings PaperC1
42012The role of chiral local field enhancements below the resolution limit of Second Harmonic Generation microscopyValev, V.K.; DE CLERCQ, Ben; Zheng, X.; Denkova, D.; Osley, E.J.; Vandendriessche, S.; Silhanek, A.V.; Volskiy, V.; Warburton, P.A.; Vandenbosch, G.A.E.; AMELOOT, Marcel; Moshchalkov, V.V.; Verbiest, T.Journal ContributionA1
52011Hotspot Decorations Map Plasmonic Patterns with the Resolution of Scanning Probe TechniquesValev, V. K.; Silhanek, A. V.; Jeyaram, Y.; Denkova, D.; DE CLERCQ, Ben; Petkov, V.; Zheng, X.; Volskiy, V.; Gillijns, W.; Vandenbosch, G. A. E.; Aktsipetrov, Oleg A.; AMELOOT, Marcel; Moshchalkov, V. V.; Verbiest, T.Journal ContributionA1
62011The origin of second harmonic generation hotspots in chiral optical metamaterials [Invited]Valev, V. K.; Zheng, X.; Biris, C. G.; Silhanek, A. V.; Volskiy, V.; DE CLERCQ, Ben; Aktsipetrov, Oleg A.; AMELOOT, Marcel; Panoiu, N. C.; Vandenbosch, G. A. E.; Moshchalkov, V. V.Journal ContributionA1