COSEMANS, Patrick Peter

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Full Name
COSEMANS, Patrick Peter
Email
patrick.cosemans@uhasselt.be
 
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Publications

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Date Issued:  1999

Results 1-3 of 3 (Search time: 0.014 seconds).

Issue DateTitleContributor(s)TypeCat.
11999Stress relaxation in Al-Cu and Al-Si-Cu thin filmsWitvrouw, A; Proost, J; Roussel, P; COSEMANS, Patrick Peter; Maex, KJournal Contribution
21999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
31999Microstructurele studie van thermisch- en stroomgedreven processen in A1-gebaseerde on-chip interconnecties m.b.v. elektronenmicroscopieCOSEMANS, Patrick PeterTheses and DissertationsT1