COSEMANS, Patrick Peter

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patrick.cosemans@uhasselt.be

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Internal UHasselt: D'HAEN, Jan

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		Issue Date	Title	Contributor(s)	Type	Cat.
	1	2000	Electromigration-induced drift in damascene and plasma-etched Al(Cu). I. Kinetics of Cu depletion in polycrystalline interconnects	Proost, J; Witvrouw, A; Maex, K; D'HAEN, Jan; COSEMANS, Patrick Peter	Journal Contribution	A1
	2	1999	Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurements	D'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, K	Journal Contribution