FUHRMANN, Marc

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Full Name
FUHRMANN, Marc
Email
marc.fuhrmann@uhasselt.be
 
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Publications

Results 1-7 of 7 (Search time: 0.003 seconds).

Issue DateTitleContributor(s)TypeCat.
12024Development of topography-independent methods for the measurement of long-range forces in atomic force microscopyFUHRMANN, MarcTheses and DissertationsT1
22023Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivitySACHS, Ian; FUHRMANN, Marc; DEFERME, Wim; Moebius, HildegardJournal ContributionA1
32022Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopyFUHRMANN, Marc; Musyanovych, Anna; THOELEN, Ronald; Moebius, HildegardJournal ContributionA1
42021Inkjet-Printed Lenses with Adjustable Contact Angle to Improve the Light Out-Coupling of Organic Light-Emitting DiodesSACHS, Ian; FUHRMANN, Marc; VERBOVEN, Inge; BASAK, Indranil; DEFERME, Wim; Moebius, HildegardJournal ContributionA1
52020The Role of Nanoparticles on Topographic Cross-Talk inElectric Force Microscopy and Magnetic Force MicroscopyFUHRMANN, Marc; KRIVCOV, Alexander; Musyanovych, Anna; THOELEN, Ronald; Moebius, HildegardJournal ContributionA1
62020Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic CrosstalkFUHRMANN, Marc; Musyanovych, Anna; THOELEN, Ronald; von Bomhard, Sibylle; Moebius, HildegardJournal ContributionA1
72019Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopyKRIVCOV, Alexander; Ehrler, Jasmin; FUHRMANN, Marc; JUNKERS, Tanja; Moebius, HildegardJournal ContributionA1