FUHRMANN, Marc

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FUHRMANN, Marc
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marc.fuhrmann@uhasselt.be
 
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Issue DateTitleContributor(s)TypeCat.
12024Development of topography-independent methods for the measurement of long-range forces in atomic force microscopyFUHRMANN, MarcTheses and DissertationsT1
22023Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivitySACHS, Ian; FUHRMANN, Marc; DEFERME, Wim; Moebius, HildegardJournal ContributionA1
32022Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopyFUHRMANN, Marc; Musyanovych, Anna; THOELEN, Ronald; Moebius, HildegardJournal ContributionA1
42021Inkjet‐Printed Lenses with Adjustable Contact Angle to Improve the Light Out‐Coupling of Organic Light‐Emitting DiodesSACHS, Ian; FUHRMANN, Marc; VERBOVEN, Inge; BASAK, Indranil; DEFERME, Wim; Moebius, HildegardJournal ContributionA1
52020Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic CrosstalkFUHRMANN, Marc; Musyanovych, Anna; THOELEN, Ronald; von Bomhard, Sibylle; Moebius, HildegardJournal ContributionA1
62020The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force MicroscopyFUHRMANN, Marc; KRIVCOV, Alexander; Musyanovych, Anna; THOELEN, Ronald; Moebius, HildegardJournal ContributionA1