WAGNER, Patrick

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WAGNER, Patrick
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patrick.wagner@uhasselt.be
 
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Internal UHasselt:  OUDEBROUCKX, Gilles
Internal UHasselt:  NIVELLE, Philippe

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Issue DateTitleContributor(s)TypeCat.
12020Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real-Time as a Tool for Sensing ApplicationsOUDEBROUCKX, Gilles; VANDENRYT, Thijs; NIVELLE, Philippe; BORMANS, Seppe; WAGNER, Patrick; THOELEN, RonaldJournal ContributionA1