ALAVI, Omid

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ALAVI, Omid
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omid.alavi@uhasselt.be
 
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Publications

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Internal UHasselt:  VAN DE SANDE, Wieland

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Issue DateTitleContributor(s)TypeCat.
12021Reliability Analysis Framework for a Grid-Tied PV-Battery System: Influence of PV and Battery Degradation on Reliability of Power Electronic SystemsALAVI, Omid; VAN DE SANDE, Wieland; VAN CAPPELLEN, Leander; DE CEUNINCK, Ward; DAENEN, Michael; Van De Sande, W.; Van Cappellen, L.; DAENEN, MarcProceedings PaperC2
22021Impact of Measurement Data Time Resolution on Predicted Lifetime of PV Inverters in Residential Solar Panel SystemsALAVI, Omid; VAN DE SANDE, Wieland; VAN CAPPELLEN, Leander; DAENEN, Michael; Van De Sande, W.; Van Cappellen, L.; DAENEN, MarcProceedings PaperC1
32020Thermo-Mechanical Stress Comparison of a GaN and SiC MOSFET for Photovoltaic ApplicationsVAN DE SANDE, Wieland; ALAVI, Omid; NIVELLE, Philippe; D'HAEN, Jan; DAENEN, MichaelJournal ContributionA1
42020The Sensitivity of an Electro-Thermal Photovoltaic DC–DC Converter Model to the Temperature Dependence of the Electrical Variables for Reliability AnalysesVAN DE SANDE, Wieland; Ravyts, Simon; ALAVI, Omid; NIVELLE, Philippe; Driesen, Johan; DAENEN, MichaelJournal ContributionA1