Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3093
Title: A degradation study of poly(p-phenylene vinylene) based light emitting diodes
Authors: Nguyen, TP
Spiesser, M
Garnier, A
DE KOK, Margreet
Tran, VH
Issue Date: 1999
Publisher: ELSEVIER SCIENCE SA
Source: MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 60(1). p. 76-81
Abstract: The degradation of poly(p-phenylene vinylene) (PPV) based light emitting diodes (LEDs) was examined by electrical measurements and by scanning electron microscopy (SEM) performed on the devices after several working cycles up to their complete destruction. It is demonstrated that the stability of the samples depends greatly on their thickness and the conduction mechanism in the polymer film is not affected by the degradation of the diodes. In the degraded samples, dark spots are formed on the surface of the electrode in circular configuration and seem to be linked to the presence of oxygen. The results are compared to those obtained in organic diodes and discussed in relation with the failure mechanism. (C) 1999 Elsevier Science S.A. All rights reserved.
Notes: Inst Mat, Lab Phys Cristalline, F-44072 Nantes 03, France. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium. CNRS, Labs Mat Organ & Proprietes Specif, F-69390 Vernaison, France.Nguyen, TP, Inst Mat, Lab Phys Cristalline, 2 Rue Houssiniere, F-44072 Nantes 03, France.
Keywords: light emitting diodes; degradation; poly(p-phenylene vinylene); conduction mechanism; scanning electron microscopy; energy dispersive X-ray spectroscopy
Document URI: http://hdl.handle.net/1942/3093
DOI: 10.1016/S0921-5107(99)00026-4
ISI #: 000080739200011
Type: Journal Contribution
Validations: ecoom 2000
Appears in Collections:Non-affiliated authors

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