DE SCHEPPER, Luc

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DE SCHEPPER, Luc
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luc.deschepper@uhasselt.be
 
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Type:  Proceedings Paper
Date Issued:  1994

Results 1-1 of 1 (Search time: 0.001 seconds).

Issue DateTitleContributor(s)TypeCat.
11994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper