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http://hdl.handle.net/1942/8139| Title: | Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scale | Authors: | DE CEUNINCK, Ward D'Haeger, V Stulens, Herwig DE SCHEPPER, Luc STALS, Lambert |
Issue Date: | 1994 | Publisher: | MATERIALS RESEARCH SOC | Source: | Murarka, SP Katz, A Tu, KN Maex, K (Ed.) ADVANCED METALLIZATION FOR DEVICES AND CIRCUITS - SCIENCE, TECHNOLOGY AND MANUFACTURABILITY. p. 663-668. | Series/Report: | MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS | Notes: | LIMBURGS UNIV CENTRUM, INST MAT RES, DIV MAT PHYS, DIEPENBEEK, B-3590 BELGIUM. | Document URI: | http://hdl.handle.net/1942/8139 | ISBN: | 1-55899-237-5 | ISI #: | A1994BB59J00086 | Type: | Proceedings Paper |
| Appears in Collections: | Research publications |
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