D'HAEN, Jan

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Full Name
D'HAEN, Jan
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jan.dhaen@uhasselt.be
 
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Author:  D'HAEN, Jan
Author:  Maex, K
Type:  Journal Contribution

Results 1-5 of 5 (Search time: 0.001 seconds).

Issue DateTitleContributor(s)TypeCat.
12000Electromigration-induced drift in damascene and plasma-etched Al(Cu). I. Kinetics of Cu depletion in polycrystalline interconnectsProost, J; Witvrouw, A; Maex, K; D'HAEN, Jan; COSEMANS, Patrick PeterJournal ContributionA1
22000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
31999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
41998The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurementsWitvrouw, A; Maex, K; DE CEUNINCK, Ward; LEKENS, Geert; D'HAEN, Jan; DE SCHEPPER, LucJournal Contribution
51998Study of Cu diffusion in an Al-1 wt%Si-0.5 wt%Cu bond pad with an Al-1 wt%Si bond wire attached using scanning electron microscopyCOSEMANS, Patrick; D'HAEN, Jan; Witvrouw, A; Proost, J; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; Maex, K; DE SCHEPPER, LucJournal Contribution