NELIS, Daniel

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NELIS, Daniel
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daniel.nelis@uhasselt.be
 
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Internal UHasselt:  NELIS, Daniel
Date Issued:  2006
Author:  De Gendt, S.

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Issue DateTitleContributor(s)TypeCat.
12006How Trace Analytical Techniques Contribute to the Research and Development of Ge and III/V Semiconductor DevicesHellin, David; Rip, Jens; Bonzom, Renaud; NELIS, Daniel; Sioncke, Sonja; BRAMMERTZ, Guy; Caymax, Matty R.; MEURIS, Marc; De Gendt, S.; Vinckier, ChrisProceedings PaperC1