HARDY, An

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HARDY, An
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an.hardy@uhasselt.be
 
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Publications

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Date Issued:  [2002 TO 2009]
Author:  De Gendt, S.

Results 1-6 of 6 (Search time: 0.001 seconds).

Issue DateTitleContributor(s)TypeCat.
12009Alternative high-k dielectrics for semiconductor applicationsVan Elshocht, S.; Adelmann, C.; Clima, S.; Pourtois, G.; Conard, T.; Delabie, A.; Franquet, A.; Lehnen, P.; Meersschaut, J.; Menou, N.; Popovici, M.; Richard, O.; Schram, T.; Wang, X. P.; HARDY, An; DEWULF, Daan; VAN BAEL, Marlies; Blomberg, T.; Pierreux, D.; Swerts, J.; Maes, J. W.; Wouters, D. J.; De Gendt, S.; Kittl, J. A.Journal ContributionA1
22009Study of interfacial reactions and phase stabilization of mixed Sc, Dy, Hf high-k oxides by attenuated total reflectance infrared spectroscopyHARDY, An; Adelmann, C.; Van Elshocht, S.; VAN DEN RUL, Heidi; VAN BAEL, Marlies; De Gendt, S.; D'OLIESLAEGER, Marc; Heyns, M.; Kittl, J.A.; MULLENS, JulesJournal ContributionA1
32008Impact of process optimizations on the electrical performance of high-k layers deposited by aqueous chemical solution depositionVan Elshocht, S.; HARDY, An; Adelmann, Christoph; Caymax, M.; Conard, T.; Franquet, A.; Richard, O.; VAN BAEL, Marlies; MULLENS, Jules; De Gendt, S.Journal ContributionA1
42008Aqueous solution-gel preparation of ultrathin ZrO2 films for gate dielectric applicationHARDY, An; Van Elshocht, S.; Adelmann, C.; Conard, T.; Franquet, A.; DOUHERET, Olivier; HAELDERMANS, Ilse; D'HAEN, Jan; De Gendt, S.; Caymax, M.; Heyns, M.; D'OLIESLAEGER, Marc; VAN BAEL, Marlies; MULLENS, JulesJournal ContributionA1
52007Aqueous chemical solution deposition - Fast screening method for alternative high-k materials applied to Nd2O3Van Elshocht, S.; HARDY, An; Witters, T.; Adelmann, C.; Caymax, M.; Conard, T.; De Gendt, S.; Franquet, A.; Richard, O.; VAN BAEL, Marlies; MULLENS, Jules; Heyns, M.Journal ContributionA1
62006Alternative gate dielectric materialsVan Elshocht, S.; HARDY, An; De Gendt, S.; Adelmann, D.; Brunco, D.; Caymax, M.; Conard, T.; Delugas, P.; Lehnen, P.; Shamiryan, D.; Vos, R.; Witters, P.; Zimmerman, P.; MEURIS, Marc; Heyns, M.Proceedings PaperC2