BIESEMANS, Leen

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BIESEMANS, Leen
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Date Issued:  2004

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Issue DateTitleContributor(s)TypeCat.
12004MTF test system with AC based dynamic joule correction for electromigration tests on interconnectsBIESEMANS, Leen; Schepers, K; VANSTREELS, Kris; D'HAEN, Jan; DE CEUNINCK, Ward; D'OLIESLAEGER, MarcJournal ContributionA1