DAENEN, Michael

Full Name
DAENEN, Michael
Email
michael.daenen@uhasselt.be
 
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Publications

Refined By:
Author:  DAENEN, Michael
Date Issued:  [2020 TO 2024]
Internal UHasselt:  BREUGELMANS, Robbe

Results 1-6 of 6 (Search time: 0.003 seconds).

Issue DateTitleContributor(s)TypeCat.
12024Method to Study Potential-Induced Degradation of Perovskite Solar Cells and Modules in an Inert EnvironmentBREUGELMANS, Robbe; LAMMAR, Stijn; AGUIRRE, Aranzazu; AERNOUTS, Tom; VERMANG, Bart; DAENEN, Michael; Hildebrandt, StefanJournal ContributionA1
22023Organic- inorganic nanoparticle composite as an electron injection/hole blocking layer in organic light emitting diodes for large area lighting applicationsSHANIVARASANTHE NITHYANANDA KUMAR, Rachith; BREUGELMANS, Robbe; JIANG, Xueshi; AHADZADEH, Shabnam; BRAMMERTZ, Guy; VERDING, Pieter; DAENEN, Michael; VAN LANDEGHEM, Melissa; Cambré, Sofie; VANDEWAL, Koen; DEFERME, WimJournal ContributionA1
32022On The Susceptibility of PID in Perovskite Modules: A Comparison of ITO and Cu ContactsBREUGELMANS, Robbe; MERCKX, Tamara; AGUIRRE, Aranzazu; LAMMAR, Stijn; CAROLUS, Jorne; AERNOUTS, Tom; VERMANG, Bart; DAENEN, MichaelProceedings PaperC2
42021A grey box model for shunting-type potential induced degradation in silicon photovoltaic cells under environmental stressSchils, Arnaud; BREUGELMANS, Robbe; CAROLUS, Jorne; Ascencio-Vásquez, Julián; Wabbes, Andreas; Bertrand, Emmanuelle; Aldalali, Bader; DAENEN, Michael; Voroshazi, Eszter; Scheerlinck, StijnProceedings PaperC1
52020Why and how to adapt PID testing for bifacial PV modules?CAROLUS, Jorne; BREUGELMANS, Robbe; Tsanakas, John; VAN DER HEIDE, Arvid; Voroshazi, Eszter; DE CEUNINCK, Ward; DAENEN, MichaelJournal ContributionA1
62020Potential-Induced Degradation of the Shunting Type: on the Origin of Sodium in Shunt PathsBREUGELMANS, Robbe; CAROLUS, Jorne; VAN DER HEIDE, Arvid; Voroshazi, Eszter; DAENEN, MichaelConference MaterialC2