POORTMANS, Jef

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POORTMANS, Jef
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jef.poortmans@uhasselt.be
 
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Refined By:
Author:  Radhakrishnan, Hariharsudan Sivaramakrishnan
Date Issued:  2018
Author:  GORDON, Ivan
Author:  Uddin, Md Gius
Author:  Simoen, Eddy

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Issue DateTitleContributor(s)TypeCat.
12018Dry etch damage in n-type crystalline silicon wafers assessed by deep-level transient spectroscopy and minority carrier lifetimeSimoen, Eddy; Radhakrishnan, Hariharsudan Sivaramakrishnan; Uddin, Md Gius; GORDON, Ivan; POORTMANS, Jef; Wang, Chong; Li, WeiJournal ContributionA1