POORTMANS, Jef

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POORTMANS, Jef
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jef.poortmans@uhasselt.be
 
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Date Issued:  2018
Author:  Radhakrishnan, Hariharsudan Sivaramakrishnan
Type:  Journal Contribution
Author:  Uddin, Md Gius

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Issue DateTitleContributor(s)TypeCat.
12018Dry etch damage in n-type crystalline silicon wafers assessed by deep-level transient spectroscopy and minority carrier lifetimeSimoen, Eddy; Radhakrishnan, Hariharsudan Sivaramakrishnan; Uddin, Md Gius; GORDON, Ivan; POORTMANS, Jef; Wang, Chong; Li, WeiJournal ContributionA1