DEPAIRE, Benoit

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Full Name
DEPAIRE, Benoit
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benoit.depaire@uhasselt.be
 
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Publications

Results 1-20 of 133 (Search time: 0.006 seconds).

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Issue DateTitleContributor(s)TypeCat.
12025Inferring Failure Processes via Causality Analysis: from Event Logs to Predictive Fault TreesDe Fazio, Roberta; DEPAIRE, Benoit; Marrone, Stefano; Verde, LauraConference MaterialC2
22025Towards an Ethogram of Exploratory Process Mining BehaviorVAN SUETENDAEL, Jessica; DEPAIRE, Benoit; JANS, Mieke; MARTIN, NielsProceedings PaperC1
32025A case study on order picking schedule deviations and their contributing factorsLEROY, Aicha; CARIS, An; DEPAIRE, Benoit; VAN GILS, Teun; BRAEKERS, KrisJournal ContributionA1
42024Quantifying Order Picking Deviations: A Real-Life Data ApproachLEROY, Aicha; CARIS, An; DEPAIRE, Benoit; VAN GILS, Teun; BRAEKERS, KrisConference MaterialC2
52024Quantifying deviations in an order picking process through data-driven analysisLEROY, Aicha; BRAEKERS, Kris; CARIS, An; DEPAIRE, Benoit; VAN GILS, TeunConference MaterialC2
62024Quantifying deviations in an order picking process through data-driven analysisLEROY, Aicha; CARIS, An; DEPAIRE, Benoit; VAN GILS, Teun; BRAEKERS, KrisConference MaterialC2
72024How to Conduct Valid Information Systems Engineering Research?Mendling, Jan; Leopold, Henrik; Meyerhenke, Henning; DEPAIRE, BenoitProceedings PaperC1
82024An empirical evaluation of unsupervised event log abstraction techniques in process miningVAN HOUDT, Greg; de Leoni, Massimiliano; MARTIN, Niels; DEPAIRE, BenoitJournal ContributionA1
92024Towards Full Population Testing in Auditing: How Many Process Deviations Should Be Labeled?LAGHMOUCH, Manal; DEPAIRE, Benoit; JANS, Mieke; Lu, X.; Pufahl, L; Song, M.Proceedings PaperC1
102024Auditors’ Risk Perception of Process Control Deficiencies: A Discrete Choice ExperimentLAGHMOUCH, Manal; LIZIN, Sebastien; Mendling, Jan; DEPAIRE, Benoit; JANS, MiekeJournal ContributionA1
112024Evaluation of Algorithmic Contributions to Business Process ManagementDEPAIRE, Benoit; Leopold, H; Mendling, J; Meyerhenke, HProceedings PaperC1
122023An Empirical Evaluation of Unsupervised Event Log Abstraction Techniques in Process MiningVAN HOUDT, Greg; de Leoni, Massimiliano; DEPAIRE, Benoit; MARTIN, NielsDatasetDS
132023AITIA-PM: Discovering the true causes of events in a process mining contextVAN HOUDT, Greg; MARTIN, Niels; DEPAIRE, BenoitJournal ContributionA1
142023Mining Recency-Frequency-Monetary enriched insights into resources' collaboration behavior from event dataJOOKEN, Leen; DEPAIRE, Benoit; JANS, MiekeJournal ContributionA1
152023Peak-to-valley drawdowns: insights into extreme path-dependent market riskGEBOERS, Hans; DEPAIRE, Benoit; Straetmans, StefanJournal ContributionA1
162023The biggest business process management problems to solve before we dieBeerepoot, Iris; Di Ciccio, Claudio; Reijers, Hajo A.; Rinderle-Ma, Stefanie; Bandara, Wasana; Burattin, Andrea; Calvanese, Diego; Chen, Tianwa; Cohen, Izack; DEPAIRE, Benoit; Di Federico, Gemma; Dumas, Marlon; van Dun, Christopher; Fehrer, Tobias; Fischer, Dominik A.; Gal, Avigdor; Indulska, Marta; Isahagian, Vatche; Klinkmueller, Christopher; Kratsch, Wolfgang; Leopold, Henrik; Van Looy, Amy; Lopez, Hugo; Lukumbuzya, Sanja; Mendling, Jan; Meyers, Lara; Moder, Linda; Montali, Marco; Muthusamy, Vinod; Reichert, Manfred; Rizk, Yara; Rosemann, Michael; Roeglinger, Maximilian; Sadiq, Shazia; Seiger, Ronny; Slaats, Tijs; Simkus, Mantas; Someh, Ida Asadi; Weber, Barbara; Weber, Ingo; Weske, Mathias; Zerbato, FrancescaJournal ContributionA1
172023A Rational Risk Policy? Why Path Dependence MattersGEBOERS, Hans; DEPAIRE, BenoitJournal ContributionA1
182023A review on drawdown risk measures and their implications for risk managementGEBOERS, Hans; DEPAIRE, Benoit; Annaert, JanJournal ContributionA1
192023Quantifying maverick picking in warehouses: a data-driven approachLEROY, Aicha; BRAEKERS, Kris; DEPAIRE, Benoit; CARIS, AnConference MaterialC2
202023A data-driven analysis of route deviations in an order picking processLEROY, Aicha; BRAEKERS, Kris; CARIS, An; DEPAIRE, Benoit; VAN GILS, T.Conference MaterialC2
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