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http://hdl.handle.net/1942/10357
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DC Field | Value | Language |
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dc.contributor.author | HERMANS, Chris | - |
dc.contributor.author | FRANCKEN, Yannick | - |
dc.contributor.author | CUYPERS, Tom | - |
dc.contributor.author | BEKAERT, Philippe | - |
dc.date.accessioned | 2010-01-13T08:31:42Z | - |
dc.date.available | 2010-01-13T08:31:42Z | - |
dc.date.issued | 2009 | - |
dc.identifier.citation | CVPR: 2009 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, VOLS 1-4. p. 1865-1872. | - |
dc.identifier.isbn | 978-1-4244-3991-1 | - |
dc.identifier.uri | http://hdl.handle.net/1942/10357 | - |
dc.description.abstract | In this paper we present a novel method for 3D structure acquisition, based on structured light. Unlike classical structured light methods, in which a static projector illuminates a scene with time-varying illumination patterns, our technique makes use of a moving projector emitting a static striped illumination pattern. This projector is translated at a constant velocity, in the direction of the projector’s horizontal axis. Illuminating the object in this manner allows us to perform a per pixel analysis, in which we decompose the recorded illumination sequence into a corresponding set of frequency components. The dominant frequency in this set can be directly converted into a corresponding depth value. This per pixel analysis allows us to preserve sharp edges in the depth image. Unlike classical structured light methods, the quality of our results is not limited by projector or camera resolution, but is solely dependent on the temporal sampling density of the captured image sequence. Additional benefits include a significant robustness against common problems encountered with structured light methods, such as occlusions, specular reflections, subsurface scattering, interreflections, and to a certain extent projector defocus. | - |
dc.language.iso | en | - |
dc.publisher | IEEE | - |
dc.title | Depth from Sliding Projections | - |
dc.type | Proceedings Paper | - |
local.bibliographicCitation.conferencename | IEEE-Computer-Society Conference on Computer Vision and Pattern Recognition Workshops | - |
local.bibliographicCitation.conferenceplace | Miami, USA - JUN 20-25, 2009 | - |
dc.identifier.epage | 1872 | - |
dc.identifier.spage | 1865 | - |
local.bibliographicCitation.jcat | C1 | - |
dc.description.notes | [Hermans, Chris; Francken, Yannick; Cuypers, Tom; Bekaert, Philippe] Hasselt Univ, TUL, IBBT, Expertise Ctr Digital Media, Diepenbeek, Belgium. christ.hermans@uhasselt.be - yannick.francken@uhasselt.be - tom.cuypers@uhasselt.be - philippe.bekaert@uhasselt.be | - |
local.type.refereed | Refereed | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | C1 | - |
dc.identifier.isi | 000279038001048 | - |
local.bibliographicCitation.btitle | CVPR: 2009 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, VOLS 1-4 | - |
item.validation | ecoom 2011 | - |
item.fulltext | With Fulltext | - |
item.accessRights | Open Access | - |
item.fullcitation | HERMANS, Chris; FRANCKEN, Yannick; CUYPERS, Tom & BEKAERT, Philippe (2009) Depth from Sliding Projections. In: CVPR: 2009 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, VOLS 1-4. p. 1865-1872.. | - |
item.contributor | HERMANS, Chris | - |
item.contributor | FRANCKEN, Yannick | - |
item.contributor | CUYPERS, Tom | - |
item.contributor | BEKAERT, Philippe | - |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
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Hermans et al. - Depth from Sliding Projections.pdf | Peer-reviewed author version | 2.47 MB | Adobe PDF | View/Open |
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