Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/10454
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dc.contributor.authorWillems, B. L.-
dc.contributor.authorDao, V. H.-
dc.contributor.authorVanacken, J.-
dc.contributor.authorChibotaru, L. F.-
dc.contributor.authorMoshchalkov, V. V.-
dc.contributor.authorGuillamon, I.-
dc.contributor.authorSuderow, H.-
dc.contributor.authorVieira, S.-
dc.contributor.authorJANSSENS, Stoffel-
dc.contributor.authorWILLIAMS, Oliver-
dc.contributor.authorHAENEN, Ken-
dc.contributor.authorWAGNER, Patrick-
dc.date.accessioned2010-02-12T15:27:09Z-
dc.date.available2010-02-12T15:27:09Z-
dc.date.issued2009-
dc.identifier.citationPHYSICAL REVIEW B, 80(22)-
dc.identifier.issn1098-0121-
dc.identifier.urihttp://hdl.handle.net/1942/10454-
dc.description.abstractWe report on low-temperature scanning tunneling microscopy/spectroscopy experiments performed on superconducting boron-doped nanocrystalline diamond (NCD) thin films prepared by chemical-vapor deposition methods. The most representative sample reveals the observed superconducting gap (Delta) highly modulated over a length scale on the order of similar to 30 nm, which is much shorter than the typical diamond grain size. The sample local and macroscopic behavior favors for the Delta modulation as being an intrinsic property of the NCD granules. On the other hand, Delta shows its temperature dependence [Delta(T)] consistent with the results obtained by Fominov and Feigel'man [Phys. Rev. B 63, 094518 (2001)], who studied theoretically the behavior of the superconducting gap of a BCS superconductor in contact with a normal layer by solving the one-dimensional Usadel equations on the superconducting side of the superconducting to normal interface.-
dc.description.sponsorshipThis work was supported by the Methusalem Funding by the Flemish Goverment, the European Science Foundation (ESF), NES program, the IAP-P6/42 project "Quantum Effects in Clusters and Nanowires," GOA, and FWO projects.-
dc.language.isoen-
dc.publisherAMER PHYSICAL SOC-
dc.subject.otherboron; diamond; magnetic moments; nanostructured materials; plasma CVD; scanning tunnelling microscopy; scanning tunnelling spectroscopy; superconducting energy gap; superconducting thin films-
dc.titleIntrinsic granularity in nanocrystalline boron-doped diamond films measured by scanning tunneling microscopy-
dc.typeJournal Contribution-
dc.identifier.issue22-
dc.identifier.volume80-
local.format.pages8-
local.bibliographicCitation.jcatA1-
dc.description.notes[Willems, B. L.; Vanacken, J.; Moshchalkov, V. V.] Katholieke Univ Leuven, INPAC, Nanoscale Superconduct & Magnetism & Pulsed Field, B-3001 Louvain, Belgium. [Willems, B. L.] Univ Nacl Mayor San Marcos, Fac Ciencias Fis, Lima 14, Peru. [Dao, V. H.; Chibotaru, L. F.] Univ Louvain, Div Quantum & Phys Chem, B-3001 Louvain, Belgium. [Dao, V. H.; Chibotaru, L. F.] Univ Louvain, INPAC, B-3001 Louvain, Belgium. [Janssens, S. D.; Williams, O. A.; Haenen, K.; Wagner, P.] Hasselt Univ, Inst Mat Res, BE-3590 Diepenbeek, Belgium. [Guillamon, I.; Suderow, H.; Vieira, S.] Univ Autonoma Madrid, Fac Ciencias, Dept Fis Mat Condensada, Inst Ciencia Mat Nicolas Cabrera,Lab Bajas Temp, E-28049 Madrid, Spain. [Williams, O. A.; Haenen, K.; Wagner, P.] IMEC VZW, Div IMOMEC, BE-3590 Diepenbeek, Belgium. bramleo@hotmail.com-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1103/PhysRevB.80.224518-
dc.identifier.isi000273228500092-
item.accessRightsClosed Access-
item.fullcitationWillems, B. L.; Dao, V. H.; Vanacken, J.; Chibotaru, L. F.; Moshchalkov, V. V.; Guillamon, I.; Suderow, H.; Vieira, S.; JANSSENS, Stoffel; WILLIAMS, Oliver; HAENEN, Ken & WAGNER, Patrick (2009) Intrinsic granularity in nanocrystalline boron-doped diamond films measured by scanning tunneling microscopy. In: PHYSICAL REVIEW B, 80(22).-
item.contributorWillems, B. L.-
item.contributorDao, V. H.-
item.contributorVanacken, J.-
item.contributorChibotaru, L. F.-
item.contributorMoshchalkov, V. V.-
item.contributorGuillamon, I.-
item.contributorSuderow, H.-
item.contributorVieira, S.-
item.contributorJANSSENS, Stoffel-
item.contributorWILLIAMS, Oliver-
item.contributorHAENEN, Ken-
item.contributorWAGNER, Patrick-
item.fulltextNo Fulltext-
item.validationecoom 2011-
crisitem.journal.issn1098-0121-
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