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|Title:||Optical detection of deep electron traps in poly(p-phenylene vinylene) light-emitting diodes||Authors:||Kuik, Martijn
Begemann, Eline J.
|Issue Date:||2011||Publisher:||AMER INST PHYSICS||Source:||Applied physics letters, 99 (18)||Abstract:||The trap-limited electron currents in poly(p-phenylene vinylene) (PPV) derivatives can be modeled using a Gaussian trap distribution that is positioned approximately 0.75 eV below the lowest unoccupied molecular orbital (LUMO) of PPV. Photothermal deflection spectroscopy measurements and internal photo-emission spectroscopy measurements confirm the claim of a Gaussian shaped trap distribution centered at 0.75 eV below the LUMO of PPV. Additionally, two PPV derivatives that differ in the number of conformational defects incorporated during synthesis exhibit identical electron trapping behavior, showing that the traps do not originate from extrinsic impurities of the synthesis or defects in the polymer chains. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3656713]||Notes:||[Kuik, M; Begemann, EJ; Blom, PWM] Univ Groningen, Zernike Inst Adv Mat, NL-9747 AG Groningen, Netherlands. [Vandenbergh, J; Goris, L; Vanderzande, DJM; Manca, JV] Univ Hasselt, Inst Mat Res, IMO IMOMEC, BE-3590 Diepenbeek, Belgium. [Blom, PWM] Holst Ctr, NL-5656 AE Eindhoven, Netherlands. [Lutsen, L; Vanderzande, DJM] IMEC, Div IMOMEC, B-3590 Diepenbeek, Belgium, firstname.lastname@example.org||Keywords:||elektrons; light emitting diodes; gaussian distribution; photoemission; spectrum analysis||Document URI:||http://hdl.handle.net/1942/12845||ISSN:||0003-6951||e-ISSN:||1077-3118||DOI:||10.1063/1.3656713||ISI #:||000296659400089||Rights:||Copyright of Applied Physics Letters is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)||Category:||A1||Type:||Journal Contribution||Validations:||ecoom 2012|
|Appears in Collections:||Research publications|
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