Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/13614
Full metadata record
DC FieldValueLanguage
dc.contributor.authorHARDY, An-
dc.contributor.authorVan Elshocht, S.-
dc.contributor.authorDE DOBBELAERE, Christopher-
dc.contributor.authorHadermann, J.-
dc.contributor.authorPourtois, G.-
dc.contributor.authorDe Gendt, S.-
dc.contributor.authorAfanas'ev, V. V.-
dc.contributor.authorVAN BAEL, Marlies-
dc.date.accessioned2012-04-27T14:32:54Z-
dc.date.available2012-04-27T14:32:54Z-
dc.date.issued2012-
dc.identifier.citationMATERIALS RESEARCH BULLETIN, 47 (3), p. 511-517-
dc.identifier.issn0025-5408-
dc.identifier.urihttp://hdl.handle.net/1942/13614-
dc.description.abstractUltrathin bismuth titanate films (Bi2Ti2O7, 5-25 nm) are deposited onto SiO2/Si substrates by aqueous chemical solution deposition and their evolution during annealing is studied. The films crystallize into a preferentially oriented, pure pyrochlore phase between 500 and 700 degrees C, depending on the film thickness and the total thermal budget. Crystallization causes a strong increase of surface roughness compared to amorphous films. An increase of the interfacial layer thickness is observed after anneal at 600 degrees C, together with intermixing of bismuth with the substrate as shown by TEM-EDX. The band gap was determined to be similar to 3 eV from photoconductivity measurements and high dielectric constants between 30 and 130 were determined from capacitance voltage measurements, depending on the processing conditions. (C) 2012 Elsevier Ltd. All rights reserved.-
dc.description.sponsorshipA. Hardy is a postdoctoral research fellow and C. De Dobbelaere a research assistant of the Research foundation-Flanders (FWO-Vlaanderen). This work is supported by the Long Term Structural Methusalem Funding by the Flemish Government and FWO research project G.0184.09. The authors thank Olivier Richard (imec) for TEM sample preparation.-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subject.otherMultidisciplinary Materials Science; Oxides; Thin films; Sol-gel chemistry; Dielectric properties-
dc.subject.otherOxides; Thin films; Sol-gel chemistry; Dielectric properties-
dc.titleProperties and thermal stability of solution processed ultrathin, high-k bismuth titanate (Bi2Ti2O7) films-
dc.typeJournal Contribution-
dc.identifier.epage517-
dc.identifier.issue3-
dc.identifier.spage511-
dc.identifier.volume47-
local.format.pages7-
local.bibliographicCitation.jcatA1-
dc.description.notes[Hardy, A.; De Dobbelaere, C.; Van Bael, M. K.] Hasselt Univ, Inst Mat Res Inorgan & Phys Chem, B-3590 Diepenbeek, Belgium. [Hardy, A.; Van Bael, M. K.] IMEC VZW, Div IMOMEC, Diepenbeek, Belgium. [Van Elshocht, S.; Pourtois, G.; De Gendt, S.] IMEC VZW, Heverlee, Belgium. [Hadermann, J.] Univ Antwerp, EMAT, Antwerp, Belgium. [De Gendt, S.] KULeuven, Dept Chem, Heverlee, Belgium. [Afanas'ev, V. V.] KULeuven, Dept Phys, Heverlee, Belgium. an.hardy@uhasselt.be-
local.publisher.placeOXFORD-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/j.materresbull.2012.01.001-
dc.identifier.isi000301994100001-
item.fullcitationHARDY, An; Van Elshocht, S.; DE DOBBELAERE, Christopher; Hadermann, J.; Pourtois, G.; De Gendt, S.; Afanas'ev, V. V. & VAN BAEL, Marlies (2012) Properties and thermal stability of solution processed ultrathin, high-k bismuth titanate (Bi2Ti2O7) films. In: MATERIALS RESEARCH BULLETIN, 47 (3), p. 511-517.-
item.validationecoom 2013-
item.contributorHARDY, An-
item.contributorVan Elshocht, S.-
item.contributorDE DOBBELAERE, Christopher-
item.contributorHadermann, J.-
item.contributorPourtois, G.-
item.contributorDe Gendt, S.-
item.contributorAfanas'ev, V. V.-
item.contributorVAN BAEL, Marlies-
item.fulltextWith Fulltext-
item.accessRightsRestricted Access-
crisitem.journal.issn0025-5408-
crisitem.journal.eissn1873-4227-
Appears in Collections:Research publications
Files in This Item:
File Description SizeFormat 
hardy 1.pdf
  Restricted Access		Published version1.57 MBAdobe PDFView/Open    Request a copy
Show simple item record

SCOPUSTM   
Citations

14
checked on Sep 4, 2020

WEB OF SCIENCETM
Citations

16
checked on May 8, 2024

Page view(s)

124
checked on Sep 7, 2022

Download(s)

100
checked on Sep 7, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.