Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/14706
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dc.contributor.authorValev, V.K.-
dc.contributor.authorDE CLERCQ, Ben-
dc.contributor.authorZheng, X.-
dc.contributor.authorBiris, C.G.-
dc.contributor.authorPanoiu, N.C.-
dc.contributor.authorSilhanek, A.V.-
dc.contributor.authorVolskiy, V.-
dc.contributor.authorAktsipetrov, Oleg A.-
dc.contributor.authorVandenbosch, G.A.E.-
dc.contributor.authorAMELOOT, Marcel-
dc.contributor.authorMoshchalkov, V.V.-
dc.contributor.authorVerbiest, T.-
dc.date.accessioned2013-03-18T13:41:29Z-
dc.date.available2013-03-18T13:41:29Z-
dc.date.issued2012-
dc.identifier.citationAndrews, David L.; Nunzi, Jean-Michel; Ostendorf, Andreas (Ed.). Proceedings of SPIE (Nanophotonics IV), p. (ART N° 842411)-
dc.identifier.isbn9780819491169-
dc.identifier.issn0277-786X-
dc.identifier.urihttp://hdl.handle.net/1942/14706-
dc.description.abstractScanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.-
dc.language.isoen-
dc.relation.ispartofseriesProceedings of SPIE-
dc.titleRobustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials-
dc.typeProceedings Paper-
local.bibliographicCitation.authorsAndrews, David L.-
local.bibliographicCitation.authorsNunzi, Jean-Michel-
local.bibliographicCitation.authorsOstendorf, Andreas-
local.bibliographicCitation.conferencedate15-19 April 2012-
local.bibliographicCitation.conferencenameSPIE Nanophotonics IV-
local.bibliographicCitation.conferenceplaceBrussels, Belgium-
local.format.pages8-
local.bibliographicCitation.jcatC1-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
local.relation.ispartofseriesnr8424-
local.bibliographicCitation.artnr842411-
dc.identifier.doi10.1117/12.922880-
dc.identifier.isi000305699700017-
local.bibliographicCitation.btitleProceedings of SPIE (Nanophotonics IV)-
item.validationecoom 2014-
item.fulltextWith Fulltext-
item.accessRightsRestricted Access-
item.fullcitationValev, V.K.; DE CLERCQ, Ben; Zheng, X.; Biris, C.G.; Panoiu, N.C.; Silhanek, A.V.; Volskiy, V.; Aktsipetrov, Oleg A.; Vandenbosch, G.A.E.; AMELOOT, Marcel; Moshchalkov, V.V. & Verbiest, T. (2012) Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials. In: Andrews, David L.; Nunzi, Jean-Michel; Ostendorf, Andreas (Ed.). Proceedings of SPIE (Nanophotonics IV), p. (ART N° 842411).-
item.contributorValev, V.K.-
item.contributorDE CLERCQ, Ben-
item.contributorZheng, X.-
item.contributorBiris, C.G.-
item.contributorPanoiu, N.C.-
item.contributorSilhanek, A.V.-
item.contributorVolskiy, V.-
item.contributorAktsipetrov, Oleg A.-
item.contributorVandenbosch, G.A.E.-
item.contributorAMELOOT, Marcel-
item.contributorMoshchalkov, V.V.-
item.contributorVerbiest, T.-
Appears in Collections:Research publications
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