Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/15376
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dc.contributor.authorSeshan, V.-
dc.contributor.authorUllien, D.-
dc.contributor.authorCastellanos-Gomez, A.-
dc.contributor.authorSachdeva, S.-
dc.contributor.authorMurthy, D. H. K.-
dc.contributor.authorSavenije, T. J.-
dc.contributor.authorAhmad, Hakeem A.-
dc.contributor.authorNunney, T. S.-
dc.contributor.authorJANSSENS, Stoffel-
dc.contributor.authorHAENEN, Ken-
dc.contributor.authorNESLADEK, Milos-
dc.contributor.authorvan der Zant, H. S. J.-
dc.contributor.authorSudholter, E. J. R.-
dc.contributor.authorde Smet, L. C. P. M.-
dc.date.accessioned2013-08-14T14:01:44Z-
dc.date.available2013-08-14T14:01:44Z-
dc.date.issued2013-
dc.identifier.citationJOURNAL OF CHEMICAL PHYSICS, 138 (23)-
dc.identifier.issn0021-9606-
dc.identifier.urihttp://hdl.handle.net/1942/15376-
dc.description.abstractA high-temperature procedure to hydrogenate diamond films using molecular hydrogen at atmospheric pressure was explored. Undoped and doped chemical vapour deposited (CVD) polycrystalline diamond films were treated according to our annealing method using a H-2 gas flow down to similar to 50 ml/min (STP) at similar to 850 degrees C. The films were extensively evaluated by surface wettability, electron affinity, elemental composition, photoconductivity, and redox studies. In addition, electrografting experiments were performed. The surface characteristics as well as the optoelectronic and redox properties of the annealed films were found to be very similar to hydrogen plasma-treated films. Moreover, the presented method is compatible with atmospheric pressure and provides a low-cost solution to hydrogenate CVD diamond, which makes it interesting for industrial applications. The plausible mechanism for the hydrogen termination of CVD diamond films is based on the formation of surface carbon dangling bonds and carbon-carbon unsaturated bonds at the applied temperature, which react with molecular hydrogen to produce a hydrogen-terminated surface. (C) 2013 AIP Publishing LLC.-
dc.description.sponsorshipWe thank Duco Bosma (Delft University of Technology) for a fruitful discussion on the analysis of the SEM data. This work was supported by the Delft University of Technology, Hasselt University, the Research Programs G.0555.10N of the Research Foundation-Flanders (FWO), the European Union (FP7) through the programs RODIN, MOLESOL, and the Marie Curie ITN "MATCON" (PITN-GA-2009-238201).-
dc.language.isoen-
dc.publisherAMER INST PHYSICS-
dc.subject.otherPhysics, Atomic, Molecular & Chemical-
dc.titleHydrogen termination of CVD diamond films by high-temperature annealing at atmospheric pressure-
dc.typeJournal Contribution-
dc.identifier.issue23-
dc.identifier.volume138-
local.format.pages6-
local.bibliographicCitation.jcatA1-
dc.description.notes[Seshan, V.; Ullien, D.; Sachdeva, S.; Murthy, D. H. K.; Savenije, T. J.; Ahmad, H. A.; Sudholter, E. J. R.; de Smet, L. C. P. M.] Delft Univ Technol, Dept Chem Engn, NL-2628 BL Delft, Netherlands. [Seshan, V.; Castellanos-Gomez, A.; van der Zant, H. S. J.] Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands. [Nunney, T. S.] Thermo Fisher Sci, E Grinstead RH19 1UB, W Sussex, England. [Janssens, S. D.; Haenen, K.; Nesladek, M.] Hasselt Univ, Inst Mat Res IMO, BE-3590 Diepenbeek, Belgium. [Janssens, S. D.; Haenen, K.; Nesladek, M.] IMEC VZW, IMOMEC, BE-3590 Diepenbeek, Belgium. l.c.p.m.desmet@tudelft.nl-
local.publisher.placeMELVILLE-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1063/1.4810866-
dc.identifier.isi000321012400032-
item.accessRightsClosed Access-
item.validationecoom 2014-
item.fulltextNo Fulltext-
item.fullcitationSeshan, V.; Ullien, D.; Castellanos-Gomez, A.; Sachdeva, S.; Murthy, D. H. K.; Savenije, T. J.; Ahmad, Hakeem A.; Nunney, T. S.; JANSSENS, Stoffel; HAENEN, Ken; NESLADEK, Milos; van der Zant, H. S. J.; Sudholter, E. J. R. & de Smet, L. C. P. M. (2013) Hydrogen termination of CVD diamond films by high-temperature annealing at atmospheric pressure. In: JOURNAL OF CHEMICAL PHYSICS, 138 (23).-
item.contributorSeshan, V.-
item.contributorUllien, D.-
item.contributorCastellanos-Gomez, A.-
item.contributorSachdeva, S.-
item.contributorMurthy, D. H. K.-
item.contributorSavenije, T. J.-
item.contributorAhmad, Hakeem A.-
item.contributorNunney, T. S.-
item.contributorJANSSENS, Stoffel-
item.contributorHAENEN, Ken-
item.contributorNESLADEK, Milos-
item.contributorvan der Zant, H. S. J.-
item.contributorSudholter, E. J. R.-
item.contributorde Smet, L. C. P. M.-
crisitem.journal.issn0021-9606-
crisitem.journal.eissn1089-7690-
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