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http://hdl.handle.net/1942/15448
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DC Field | Value | Language |
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dc.contributor.author | DUCHATEAU, Stijn | - |
dc.contributor.author | BROEDERS, Jeroen | - |
dc.contributor.author | CROUX, Dieter | - |
dc.contributor.author | RIGO, Jean-Michel | - |
dc.contributor.author | WAGNER, Patrick | - |
dc.contributor.author | THOELEN, Ronald | - |
dc.contributor.author | DE CEUNINCK, Ward | - |
dc.date.accessioned | 2013-08-21T14:01:18Z | - |
dc.date.available | 2013-08-21T14:01:18Z | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | Physica Status Solidi C, 10 (5), p. 882-888 | - |
dc.identifier.issn | 1862-6351 | - |
dc.identifier.uri | http://hdl.handle.net/1942/15448 | - |
dc.description.abstract | Cell proliferation can be monitored by a wide range of well-established techniques. Most of the principles used rely on optical, single end-point methods, often involving the use of absorbent, fluorescent or luminescent compounds. These additives can interfere with the cell growth, thus producing distorted results. Electrochemical impedance spectroscopy provides a solution for this problem and enables continuous monitoring without interference. However equipment for this measurement technique is often bulky, highly expensive and lacks multichannel features. This paper presents a low-cost, compact hardware platform optimized for proliferation measurements, together with custom software to ease interpretation and physical modelling of data. Performance is demonstrated and measurement parameters are fine-tuned for three commonly used cell types in proliferation measurements. | - |
dc.language.iso | en | - |
dc.relation.ispartofseries | Physica Status Solidi C-Current Topics in Solid State Physics | - |
dc.subject.other | impedance | - |
dc.title | Cell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assays | - |
dc.type | Proceedings Paper | - |
local.bibliographicCitation.authors | Krishna, S. | - |
local.bibliographicCitation.authors | Plis, E. | - |
local.bibliographicCitation.conferencedate | AUG 27-30, 2012 | - |
local.bibliographicCitation.conferencename | 39th International Symposium on Compound Semiconductors (ISCS) | - |
local.bibliographicCitation.conferenceplace | Univ Calif Santa Barbara (UCSB) Campus, Santa Barbara, CA | - |
dc.identifier.epage | 888 | - |
dc.identifier.issue | 5 | - |
dc.identifier.spage | 882 | - |
dc.identifier.volume | 10 | - |
local.bibliographicCitation.jcat | C1 | - |
dc.description.notes | Duchateau, S (reprint author), Xios Univ Coll, Agoralaan Gebouw H, B-3590 Diepenbeek, Belgium. stijn.duchateau@uhasselt.be | - |
local.type.refereed | Refereed | - |
local.type.specified | Proceedings Paper | - |
local.relation.ispartofseriesnr | 5 | - |
dc.identifier.doi | 10.1002/pssc.201200748 | - |
dc.identifier.isi | 000322514100038 | - |
local.bibliographicCitation.btitle | Physica Status Solidi C | - |
item.contributor | DUCHATEAU, Stijn | - |
item.contributor | BROEDERS, Jeroen | - |
item.contributor | CROUX, Dieter | - |
item.contributor | RIGO, Jean-Michel | - |
item.contributor | WAGNER, Patrick | - |
item.contributor | THOELEN, Ronald | - |
item.contributor | DE CEUNINCK, Ward | - |
item.validation | ecoom 2014 | - |
item.fulltext | With Fulltext | - |
item.accessRights | Restricted Access | - |
item.fullcitation | DUCHATEAU, Stijn; BROEDERS, Jeroen; CROUX, Dieter; RIGO, Jean-Michel; WAGNER, Patrick; THOELEN, Ronald & DE CEUNINCK, Ward (2013) Cell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assays. In: Physica Status Solidi C, 10 (5), p. 882-888. | - |
Appears in Collections: | Research publications |
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