Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/15448
Full metadata record
DC FieldValueLanguage
dc.contributor.authorDUCHATEAU, Stijn-
dc.contributor.authorBROEDERS, Jeroen-
dc.contributor.authorCROUX, Dieter-
dc.contributor.authorRIGO, Jean-Michel-
dc.contributor.authorWAGNER, Patrick-
dc.contributor.authorTHOELEN, Ronald-
dc.contributor.authorDE CEUNINCK, Ward-
dc.date.accessioned2013-08-21T14:01:18Z-
dc.date.available2013-08-21T14:01:18Z-
dc.date.issued2013-
dc.identifier.citationPhysica Status Solidi C, 10 (5), p. 882-888-
dc.identifier.issn1862-6351-
dc.identifier.urihttp://hdl.handle.net/1942/15448-
dc.description.abstractCell proliferation can be monitored by a wide range of well-established techniques. Most of the principles used rely on optical, single end-point methods, often involving the use of absorbent, fluorescent or luminescent compounds. These additives can interfere with the cell growth, thus producing distorted results. Electrochemical impedance spectroscopy provides a solution for this problem and enables continuous monitoring without interference. However equipment for this measurement technique is often bulky, highly expensive and lacks multichannel features. This paper presents a low-cost, compact hardware platform optimized for proliferation measurements, together with custom software to ease interpretation and physical modelling of data. Performance is demonstrated and measurement parameters are fine-tuned for three commonly used cell types in proliferation measurements.-
dc.language.isoen-
dc.relation.ispartofseriesPhysica Status Solidi C-Current Topics in Solid State Physics-
dc.subject.otherimpedance-
dc.titleCell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assays-
dc.typeProceedings Paper-
local.bibliographicCitation.authorsKrishna, S.-
local.bibliographicCitation.authorsPlis, E.-
local.bibliographicCitation.conferencedateAUG 27-30, 2012-
local.bibliographicCitation.conferencename39th International Symposium on Compound Semiconductors (ISCS)-
local.bibliographicCitation.conferenceplaceUniv Calif Santa Barbara (UCSB) Campus, Santa Barbara, CA-
dc.identifier.epage888-
dc.identifier.issue5-
dc.identifier.spage882-
dc.identifier.volume10-
local.bibliographicCitation.jcatC1-
dc.description.notesDuchateau, S (reprint author), Xios Univ Coll, Agoralaan Gebouw H, B-3590 Diepenbeek, Belgium. stijn.duchateau@uhasselt.be-
local.type.refereedRefereed-
local.type.specifiedProceedings Paper-
local.relation.ispartofseriesnr5-
dc.identifier.doi10.1002/pssc.201200748-
dc.identifier.isi000322514100038-
local.bibliographicCitation.btitlePhysica Status Solidi C-
item.contributorDUCHATEAU, Stijn-
item.contributorBROEDERS, Jeroen-
item.contributorCROUX, Dieter-
item.contributorRIGO, Jean-Michel-
item.contributorWAGNER, Patrick-
item.contributorTHOELEN, Ronald-
item.contributorDE CEUNINCK, Ward-
item.fulltextWith Fulltext-
item.validationecoom 2014-
item.fullcitationDUCHATEAU, Stijn; BROEDERS, Jeroen; CROUX, Dieter; RIGO, Jean-Michel; WAGNER, Patrick; THOELEN, Ronald & DE CEUNINCK, Ward (2013) Cell proliferation monitoring by multiplexed electrochemical impedance spectroscopy on microwell assays. In: Physica Status Solidi C, 10 (5), p. 882-888.-
item.accessRightsRestricted Access-
Appears in Collections:Research publications
Files in This Item:
File Description SizeFormat 
rigo.pdf
  Restricted Access
383.41 kBAdobe PDFView/Open    Request a copy
Show simple item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.