Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/1585
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | DOUHERET, Olivier | - |
dc.contributor.author | LUTSEN, Laurence | - |
dc.contributor.author | SWINNEN, Ann | - |
dc.contributor.author | BRESELGE, Martin | - |
dc.contributor.author | VANDEWAL, Koen | - |
dc.contributor.author | GORIS, Ludwig | - |
dc.contributor.author | MANCA, Jean | - |
dc.date.accessioned | 2007-06-05T11:59:16Z | - |
dc.date.available | 2007-06-05T11:59:16Z | - |
dc.date.issued | 2006 | - |
dc.identifier.citation | APPLIED PHYSICS LETTERS, 89(3). p. 032107-... | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/1942/1585 | - |
dc.description.abstract | Conductive atomic force microscopy (CAFM) is introduced to perform electrical characterization of organic photovoltaic blends with high spatial resolution. Reference blends used in organic bulk heterojunction solar cells are investigated. The ability of CAFM to electrically evidence phase separated donor and acceptor regions is demonstrated. Furthermore, local spectroscopy is performed to analyze charge transport mechanisms in the blends. Significant modifications of the electrical properties of the semiconducting polymers are shown to occur after blending with fullerene derivatives. Finally, the sensitivity of CAFM to photoelectrical phenomena is revealed. Current variations of few picoamperes are locally observed under illumination of P3HT | - |
dc.language.iso | en | - |
dc.publisher | American Institute of Physics | - |
dc.title | Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy | - |
dc.type | Journal Contribution | - |
dc.identifier.issue | 3 | - |
dc.identifier.spage | 032107 | - |
dc.identifier.volume | 89 | - |
local.bibliographicCitation.jcat | A1 | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1063/1.2227846 | - |
dc.identifier.isi | 000239174100058 | - |
item.fullcitation | DOUHERET, Olivier; LUTSEN, Laurence; SWINNEN, Ann; BRESELGE, Martin; VANDEWAL, Koen; GORIS, Ludwig & MANCA, Jean (2006) Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy. In: APPLIED PHYSICS LETTERS, 89(3). p. 032107-.... | - |
item.accessRights | Closed Access | - |
item.contributor | DOUHERET, Olivier | - |
item.contributor | LUTSEN, Laurence | - |
item.contributor | SWINNEN, Ann | - |
item.contributor | BRESELGE, Martin | - |
item.contributor | VANDEWAL, Koen | - |
item.contributor | GORIS, Ludwig | - |
item.contributor | MANCA, Jean | - |
item.fulltext | No Fulltext | - |
item.validation | ecoom 2007 | - |
crisitem.journal.issn | 0003-6951 | - |
crisitem.journal.eissn | 1077-3118 | - |
Appears in Collections: | Research publications |
SCOPUSTM
Citations
73
checked on Sep 2, 2020
WEB OF SCIENCETM
Citations
83
checked on Apr 14, 2024
Page view(s)
100
checked on Jun 28, 2023
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.