Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/16365
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dc.contributor.authorKhelifi, S.-
dc.contributor.authorVoroshazi, E.-
dc.contributor.authorSPOLTORE, Donato-
dc.contributor.authorPIERSIMONI, Fortunato-
dc.contributor.authorBERTHO, Sabine-
dc.contributor.authorAERNOUTS, Tom-
dc.contributor.authorMANCA, Jean-
dc.contributor.authorLauwaert, J.-
dc.contributor.authorVrielinck, H.-
dc.contributor.authorBurgelman, M.-
dc.date.accessioned2014-02-20T11:19:28Z-
dc.date.available2014-02-20T11:19:28Z-
dc.date.issued2014-
dc.identifier.citationSOLAR ENERGY MATERIALS AND SOLAR CELLS, 120, p. 244-252-
dc.identifier.issn0927-0248-
dc.identifier.urihttp://hdl.handle.net/1942/16365-
dc.description.abstractWe investigate the photodegradation in inert atmosphere of (poly 3-hexylthiophene:[6,6]-phenyl-C61-butyric acid methyl ester) (P3HT:PCBM) heterojunction solar cells under continuous illumination using advanced electrical characterization and a device modeling tool. Our results indicate that different failure mechanisms contribute to the performance loss. The first 250 h of illumination induced p-type doping and recombination related to traps in the blend which mainly decreases the short-circuit current and the efficiency of the cells. Device modeling and simulation allowed us to prove that increased p-type doping of the blend provoke the loss in the short-circuit current and the quantum efficiency by simultaneous reduction of charge carrier mobility and the electric field together with a shrink of the space charge region. Transmission electron microscopy (TEM) measurements reveal a change in the blend morphology upon long illumination times manifested by phase segregation in the blend. The reduction in the open-circuit voltage is reported to be related to a slight reduction of the charge transfer energy (CT) upon 700 h of illumination aging. The final failure mechanism was a rapid drop in the fill factor which occurs upon 1000 h of illumination and manifested by the appearance of an S-shape J-V characteristic. This failure mechanism is linked to the reduction of charge extraction caused by a reduced surface recombination velocity at the contacts. (C) 2013 Elsevier B.V. All rights reserved.-
dc.description.sponsorshipThe authors would like to acknowledge the IWT-SBO project PolySpec financed by the Institute of Science and Technology, as well as the Research Foundation-Flanders for their financial support.-
dc.language.isoen-
dc.rights© 2013 Elsevier B.V. All rights reserved.-
dc.subject.otherOrganic photovoltaics; P3HT:PCBM; Traps; Illumination aging; Characterization; Modeling-
dc.titleEffect of light induced degradation on electrical transport and charge extraction in polythiophene:Fullerene (P3HT:PCBM) solar cells-
dc.typeJournal Contribution-
dc.identifier.epage252-
dc.identifier.spage244-
dc.identifier.volume120-
local.bibliographicCitation.jcatA1-
dc.description.notesKhelifi, S (reprint author), Univ Ghent, Dept Elect & Informat Syst ELIS, Sint Pietersnieuwstr 41, B-9000 Ghent, Belgium, samira.khelifi@elis.ugent.be-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1016/j.solmat.2013.09.010-
dc.identifier.isi000329595400032-
item.validationecoom 2015-
item.contributorKhelifi, S.-
item.contributorVoroshazi, E.-
item.contributorSPOLTORE, Donato-
item.contributorPIERSIMONI, Fortunato-
item.contributorBERTHO, Sabine-
item.contributorAERNOUTS, Tom-
item.contributorMANCA, Jean-
item.contributorLauwaert, J.-
item.contributorVrielinck, H.-
item.contributorBurgelman, M.-
item.fullcitationKhelifi, S.; Voroshazi, E.; SPOLTORE, Donato; PIERSIMONI, Fortunato; BERTHO, Sabine; AERNOUTS, Tom; MANCA, Jean; Lauwaert, J.; Vrielinck, H. & Burgelman, M. (2014) Effect of light induced degradation on electrical transport and charge extraction in polythiophene:Fullerene (P3HT:PCBM) solar cells. In: SOLAR ENERGY MATERIALS AND SOLAR CELLS, 120, p. 244-252.-
item.fulltextWith Fulltext-
item.accessRightsRestricted Access-
crisitem.journal.issn0927-0248-
crisitem.journal.eissn1879-3398-
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