Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/16397
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | WANG, Yuandi | - |
dc.contributor.author | ROIJAKKERS, Nadine | - |
dc.contributor.author | VANHAVERBEKE, Wim | - |
dc.date.accessioned | 2014-03-07T09:08:35Z | - |
dc.date.available | 2014-03-07T09:08:35Z | - |
dc.date.issued | 2014 | - |
dc.identifier.citation | SCIENTOMETRICS, 98 (1), p. 743-761 | - |
dc.identifier.issn | 0138-9130 | - |
dc.identifier.uri | http://hdl.handle.net/1942/16397 | - |
dc.description.abstract | There is a wealth of research on technological learning in developing countries, but few scholars have clearly addressed the issue of learning time in an empirical way. This paper aims to fill this void by presenting an empirical investigation of the time needed by Chinese firms to learn from the technologies that they have in-licensed. Furthermore, we analyzed in detail the antecedents leading to an acceleration or deceleration of the learning process among Chinese licensees. The results of an event history analysis indicate that recipient firms take on average 5.8 years to learn from their in-licensed technologies. The absorptive capacity and firm age of the licensees, the technology licensing scale, the age of the licensed technology, and the desorptive capability of the licensor firm all play a role in shortening the learning time. | - |
dc.description.sponsorship | Sichuan University | - |
dc.language.iso | en | - |
dc.rights | © Akade´miai Kiado´, Budapest, Hungary 2013. | - |
dc.subject.other | technological learning; innovation speed; technology license; event history analysis; patent citations; China | - |
dc.title | How fast do Chinese firms learn and catch up? Evidence from patent citations | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 761 | - |
dc.identifier.issue | 1 | - |
dc.identifier.spage | 743 | - |
dc.identifier.volume | 98 | - |
local.bibliographicCitation.jcat | A1 | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.identifier.doi | 10.1007/s11192-013-1016-6 | - |
dc.identifier.isi | 000329319200045 | - |
item.fullcitation | WANG, Yuandi; ROIJAKKERS, Nadine & VANHAVERBEKE, Wim (2014) How fast do Chinese firms learn and catch up? Evidence from patent citations. In: SCIENTOMETRICS, 98 (1), p. 743-761. | - |
item.validation | ecoom 2015 | - |
item.contributor | WANG, Yuandi | - |
item.contributor | ROIJAKKERS, Nadine | - |
item.contributor | VANHAVERBEKE, Wim | - |
item.fulltext | With Fulltext | - |
item.accessRights | Restricted Access | - |
crisitem.journal.issn | 0138-9130 | - |
crisitem.journal.eissn | 1588-2861 | - |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
art%3A10.1007%2Fs11192-013-1016-6.pdf Restricted Access | 283.21 kB | Adobe PDF | View/Open Request a copy |
SCOPUSTM
Citations
1
checked on Sep 7, 2020
WEB OF SCIENCETM
Citations
14
checked on May 8, 2024
Page view(s)
104
checked on Sep 7, 2022
Download(s)
130
checked on Sep 7, 2022
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.