Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/1789
Full metadata record
DC FieldValueLanguage
dc.contributor.authorEGGHE, Leo-
dc.date.accessioned2007-09-07T12:32:52Z-
dc.date.available2007-09-07T12:32:52Z-
dc.date.issued2007-
dc.identifier.citationJOURNAL OF INFORMETRICS, 1(1). p. 1-1-
dc.identifier.issn1751-1577-
dc.identifier.urihttp://hdl.handle.net/1942/1789-
dc.language.isoen-
dc.publisherElsevier-
dc.titleWelcome to the Journal of Informetrics-
dc.typeJournal Contribution-
dc.identifier.epage1-
dc.identifier.issue1-
dc.identifier.spage1-
dc.identifier.volume1-
local.bibliographicCitation.jcatM-
local.type.refereedRefereed-
local.type.specifiedMeeting Abstract-
dc.bibliographicCitation.oldjcatA5-
dc.identifier.doi10.1016/j.joi.2006.09.003-
dc.identifier.isi000253974300001-
item.accessRightsOpen Access-
item.fulltextWith Fulltext-
item.fullcitationEGGHE, Leo (2007) Welcome to the Journal of Informetrics. In: JOURNAL OF INFORMETRICS, 1(1). p. 1-1.-
item.contributorEGGHE, Leo-
crisitem.journal.issn1751-1577-
crisitem.journal.eissn1875-5879-
Appears in Collections:Research publications
Files in This Item:
File Description SizeFormat 
welcome.pdfNon Peer-reviewed author version17.08 kBAdobe PDFView/Open
Show simple item record

SCOPUSTM   
Citations

3
checked on Sep 3, 2020

WEB OF SCIENCETM
Citations

4
checked on Apr 21, 2024

Page view(s)

52
checked on Sep 6, 2022

Download(s)

182
checked on Sep 6, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.