Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/1789
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dc.contributor.authorEGGHE, Leo-
dc.date.accessioned2007-09-07T12:32:52Z-
dc.date.available2007-09-07T12:32:52Z-
dc.date.issued2007-
dc.identifier.citationJOURNAL OF INFORMETRICS, 1(1). p. 1-1-
dc.identifier.issn1751-1577-
dc.identifier.urihttp://hdl.handle.net/1942/1789-
dc.language.isoen-
dc.publisherElsevier-
dc.titleWelcome to the Journal of Informetrics-
dc.typeJournal Contribution-
dc.identifier.epage1-
dc.identifier.issue1-
dc.identifier.spage1-
dc.identifier.volume1-
local.bibliographicCitation.jcatM-
local.type.refereedRefereed-
local.type.specifiedMeeting Abstract-
dc.bibliographicCitation.oldjcatA5-
dc.identifier.doi10.1016/j.joi.2006.09.003-
dc.identifier.isi000253974300001-
item.contributorEGGHE, Leo-
item.fullcitationEGGHE, Leo (2007) Welcome to the Journal of Informetrics. In: JOURNAL OF INFORMETRICS, 1(1). p. 1-1.-
item.accessRightsOpen Access-
item.fulltextWith Fulltext-
crisitem.journal.issn1751-1577-
crisitem.journal.eissn1875-5879-
Appears in Collections:Research publications
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