Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/18097
Title: Microstructural analysis of 9.7% efficient Cu2ZnSnSe4 thin film solar cells
Authors: Buffiere, M.
BRAMMERTZ, Guy 
Batuk, Maria
Verbist, C.
Mangin, Denis
Koble, C.
Hadermann, J.
MEURIS, Marc 
POORTMANS, Jef 
Issue Date: 2014
Publisher: AMER INST PHYSICS
Source: APPLIED PHYSICS LETTERS, 105 (18)
Abstract: This work presents a detailed analysis of the microstructure and the composition of our record Cu2ZnSnSe4 (CZTSe)-CdS-ZnO solar cell with a total area efficiency of 9.7%. The average composition of the CZTSe crystallites is Cu1.94Zn1.12Sn0.95Se3.99. Large crystals of ZnSe secondary phase (up to 400 nm diameter) are observed at the voids between the absorber and the back contact, while smaller ZnSe domains are segregated at the grain boundaries and close to the surface of the CZTSe grains. An underlying layer and some particles of CuxSe are observed at the Mo-MoSe2-Cu2ZnSnSe4 interface. The free surface of the voids at the back interface is covered by an amorphous layer containing Cu, S, O, and C, while the presence of Cd, Na, and K is also observed in this region. (C) 2014 AIP Publishing LLC.
Notes: [Buffiere, M.; Poortmans, J.] Katholieke Univ Leuven, Dept Elect Engn ESAT, B-3001 Heverlee, Belgium. [Buffiere, M.; Poortmans, J.] Imec Partner Solliance, B-3001 Leuven, Belgium. [Brammertz, G.; Meuris, M.] Imec Div IMOMEC Partner Solliance, B-3590 Diepenbeek, Belgium. [Brammertz, G.; Meuris, M.; Poortmans, J.] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Batuk, M.; Verbist, C.; Hadermann, J.] Univ Antwerp, Electron Microscopy Mat Sci EMAT, B-2020 Antwerp, Belgium. [Mangin, D.] Univ Lorraine, Inst Jean Lamour, F-54011 Nancy, France. [Koble, C.] Helmholtz Zentrum Berlin Mat & Energie GmbH, D-14109 Berlin, Germany.
Document URI: http://hdl.handle.net/1942/18097
ISSN: 0003-6951
e-ISSN: 1077-3118
DOI: 10.1063/1.4901401
ISI #: 000345000000086
Rights: © 2014 AIP Publishing LLC.
Category: A1
Type: Journal Contribution
Validations: ecoom 2015
Appears in Collections:Research publications

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