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http://hdl.handle.net/1942/19662
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DC Field | Value | Language |
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dc.contributor.author | Harniman, Robert L. | - |
dc.contributor.author | Fox, Oliver J. L. | - |
dc.contributor.author | JANSSEN, Wiebke | - |
dc.contributor.author | DRIJKONINGEN, Sien | - |
dc.contributor.author | HAENEN, Ken | - |
dc.contributor.author | May, Paul W. | - |
dc.date.accessioned | 2015-10-06T07:14:37Z | - |
dc.date.available | 2015-10-06T07:14:37Z | - |
dc.date.issued | 2015 | - |
dc.identifier.citation | CARBON, 94, p. 386-395 | - |
dc.identifier.issn | 0008-6223 | - |
dc.identifier.uri | http://hdl.handle.net/1942/19662 | - |
dc.description.abstract | A detailed investigation of electron emission from a set of chemical vapour deposited (CVD) diamond films is reported using high-resolution PeakForce-controlled tunnelling atomic force microscopy (PF-TUNA). Electron field emission originates preferentially from the grain boundaries in low-conductivity polycrystalline diamond samples, and not from the top of features or sharp edges. Samples with smaller grains and more grain boundaries, such as nanocrystalline diamond, produce a higher emission current over a more uniform area than diamond samples with larger grain size. Light doping with N, B or P increases the grain conductivity, with the result that the emitting grain-boundary sites become broader as the emission begins to creep up the grain sidewalls. For heavy B doping, where the grains are now more conducting than the grain boundaries, emission comes from both the grain boundaries and the grains almost equally. Lightly P-doped diamond samples show emission from step-edges on the (111) surfaces. Emission intensity was time dependent, with the measured current dropping to similar to 10% of its initial value similar to 30 h after removal from the CVD chamber. This decrease is ascribed to the build-up of adsorbates on the surface along with an increase in the surface conductivity due to surface transfer doping. (C) 2015 The Authors. Published by Elsevier Ltd. | - |
dc.description.sponsorship | PWM thanks the EPSRC for financial support through grant EP/H043292/1. PF-TUNA was conducted in the Imaging Unit of the School of Chemistry, University of Bristol. KH thanks the Research Foundation - Flanders (FWO) for financial support through project G.0456.12. The raw data for the figures and analysis in this paper can be accessed via the University of Bristol data repository, doi: 10.5523/ bris.1pfcexif69sm81we336206dzdc. | - |
dc.language.iso | en | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.rights | © 2015 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY license (http:// creativecommons.org/licenses/by/4.0/). | - |
dc.title | Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 395 | - |
dc.identifier.spage | 386 | - |
dc.identifier.volume | 94 | - |
local.format.pages | 10 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | [Harniman, Robert L.; Fox, Oliver J. L.; May, Paul W.] Univ Bristol, Sch Chem, Bristol BS8 1TL, Avon, England. [Janssen, Wiebke; Drijkoningen, Sien; Haenen, Ken] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Janssen, Wiebke; Haenen, Ken] IMEC VZW, IMOMEC, B-3590 Diepenbeek, Belgium. | - |
local.publisher.place | OXFORD | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.identifier.doi | 10.1016/j.carbon.2015.06.082 | - |
dc.identifier.isi | 000360294900045 | - |
item.contributor | Harniman, Robert L. | - |
item.contributor | Fox, Oliver J. L. | - |
item.contributor | JANSSEN, Wiebke | - |
item.contributor | DRIJKONINGEN, Sien | - |
item.contributor | HAENEN, Ken | - |
item.contributor | May, Paul W. | - |
item.fullcitation | Harniman, Robert L.; Fox, Oliver J. L.; JANSSEN, Wiebke; DRIJKONINGEN, Sien; HAENEN, Ken & May, Paul W. (2015) Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy. In: CARBON, 94, p. 386-395. | - |
item.accessRights | Open Access | - |
item.fulltext | With Fulltext | - |
item.validation | ecoom 2016 | - |
crisitem.journal.issn | 0008-6223 | - |
crisitem.journal.eissn | 1873-3891 | - |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
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harniman 1.pdf | Published version | 4.38 MB | Adobe PDF | View/Open |
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