Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/19773
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dc.contributor.authorQiu, Weiming-
dc.contributor.authorPaetzold, Ulrich W.-
dc.contributor.authorGehlhaar, Robert-
dc.contributor.authorSmirnov, Vladimir-
dc.contributor.authorBOYEN, Hans-Gerd-
dc.contributor.authorTait, Jeffrey G.-
dc.contributor.authorCONINGS, Bert-
dc.contributor.authorZhang, Weimin-
dc.contributor.authorNielsen, Christian B.-
dc.contributor.authorMcCulloch, Iain-
dc.contributor.authorFroyen, Ludo-
dc.contributor.authorHeremans, Paul-
dc.contributor.authorCheyns, David-
dc.date.accessioned2015-11-16T10:13:05Z-
dc.date.available2015-11-16T10:13:05Z-
dc.date.issued2015-
dc.identifier.citationJournal of Materials Chemistry A, 3 (45), p. 22824-22829-
dc.identifier.issn2050-7488-
dc.identifier.urihttp://hdl.handle.net/1942/19773-
dc.description.abstractThe TiO2 layer made by electron beam (e-beam) induced evaporation is demonstrated as an electron transport layer (ETL) in high efficiency planar junction perovskite solar cells. The temperature of the substrate and the thickness of the TiO2 layer can be easily controlled with this e-beam induced evaporation method, which enables the usage of different types of substrates. Here, perovskite solar cells based on CH3NH3PbI3−xClx achieve power conversion efficiencies of 14.6% on glass and 13.5% on flexible plastic substrates. The relationship between the TiO2 layer thickness and the perovskite morphology is studied by scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS). Our results indicate that the pinholes in the thin TiO2 layer lead to pinholes in the perovskite layer. By optimizing the TiO2 thickness, perovskite layers with substantially increased surface coverage and reduced pinhole areas are fabricated, increasing overall device performance.-
dc.description.sponsorshipThe authors would like to acknowledge Kjell Cnops for the XRD measurement, Elmar Neumann for the cross-sectional sample preparation using FIB, and Ziyang Liu for taking the top-view SEM images. This research has received (partial) funding from the Flemish Government - Department of Economics, Science and Innovation. J. G. Tait would like to acknowledge partial funding by the Natural Science and Engineering Council of Canada. U. W. Paetzold would like to acknowledge the financial support from the PostDoc Program of the German Academic Exchange Program (DAAD).-
dc.language.isoen-
dc.rightsThis journal is © The Royal Society of Chemistry 2015-
dc.subject.otherperovskite solar cells; electron transport layer; flexible substrates-
dc.titleAn electron beam evaporated TiO2 layer for high efficiency planar perovskite solar cells on flexible polyethylene terephthalate substrates-
dc.typeJournal Contribution-
dc.identifier.epage22829-
dc.identifier.issue45-
dc.identifier.spage22824-
dc.identifier.volume3-
local.bibliographicCitation.jcatA1-
dc.description.notesQiu, WM (reprint author), Imec, Kapeldreef 75, B-3001 Heverlee, Belgium. Weiming.Qiu@imec.be; Paul.Heremans@imec.be-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1039/C5TA07515G-
dc.identifier.isi000365011400035-
item.contributorQiu, Weiming-
item.contributorPaetzold, Ulrich W.-
item.contributorGehlhaar, Robert-
item.contributorSmirnov, Vladimir-
item.contributorBOYEN, Hans-Gerd-
item.contributorTait, Jeffrey G.-
item.contributorCONINGS, Bert-
item.contributorZhang, Weimin-
item.contributorNielsen, Christian B.-
item.contributorMcCulloch, Iain-
item.contributorFroyen, Ludo-
item.contributorHeremans, Paul-
item.contributorCheyns, David-
item.fullcitationQiu, Weiming; Paetzold, Ulrich W.; Gehlhaar, Robert; Smirnov, Vladimir; BOYEN, Hans-Gerd; Tait, Jeffrey G.; CONINGS, Bert; Zhang, Weimin; Nielsen, Christian B.; McCulloch, Iain; Froyen, Ludo; Heremans, Paul & Cheyns, David (2015) An electron beam evaporated TiO2 layer for high efficiency planar perovskite solar cells on flexible polyethylene terephthalate substrates. In: Journal of Materials Chemistry A, 3 (45), p. 22824-22829.-
item.accessRightsRestricted Access-
item.fulltextWith Fulltext-
item.validationecoom 2016-
crisitem.journal.issn2050-7488-
crisitem.journal.eissn2050-7496-
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