Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2142
Title: Effect of crystallization parameters on the properties of Bi3.5La0.5Ti3O12 thin films deposited by aqueous chemical solution deposition
Authors: HARDY, An 
NELIS, Daniel 
VANHOYLAND, Geert 
VAN BAEL, Marlies 
VAN DEN RUL, Heidi 
MULLENS, Jules 
VAN POUCKE, Lucien 
D'HAEN, Jan 
Goux, L
Wouters, DJ
Issue Date: 2005
Publisher: ELSEVIER SCIENCE SA
Source: THIN SOLID FILMS, 492(1-2). p. 105-113
Abstract: Several crystallization parameters were studied during the fabrication of Bi3.5La0.5Ti3O12 thin films by means of a new aqueous chemical solution deposition method. Their effect on the microstructure, orientation, crystal structure and ferroelectric properties of the thin films was examined using scanning electron microscopy, X-ray and electron back-scattering diffraction and ferroelectric hysteresis loop measurements. The thermal treatment was optimized by applying an intermediate crystallization step for each layer, which led to the formation of dense films with ferroelectric properties. Without this intermediate crystallization, the films were shortcircuited due to the high porosity. Subsequently, the effect of the crystallization temperature on Bi3.5La0.5Ti3O12 thin films prepared from precursors containing 10 mol% Bi3+ excess, was looked into. The P-r increased linearly with the crystallization temperature between 600 and 700 degrees C. Finally, the concentration of O-2 in the ambient during the crystallization was varied. Hillocking occurred below 10% O-2 due to a reaction of the substrate. The ferroelectric properties also deteriorated when crystallization was carried out below a critical O-2 partial pressure. (c) 2005 Elsevier B.V All rights reserved.
Notes: Hasselt Univ, Inst Mat Res, IMO, B-3590 Diepenbeek, Belgium. IMEC VZW, Div IMOMEC, B-3590 Diepenbeek, Belgium. IMEC VZW, B-3001 Heverlee, Belgium.Mullens, J, Hasselt Univ, Inst Mat Res, IMO, Agoralaan Bldg D, B-3590 Diepenbeek, Belgium.jules.mullens@uhasselt.be
Keywords: chemical deposition; ferroelectric properties; X-ray diffraction; bismuth titanate
Document URI: http://hdl.handle.net/1942/2142
ISSN: 0040-6090
e-ISSN: 1879-2731
DOI: 10.1016/j.tsf.2005.06.065
ISI #: 000232592100019
Category: A1
Type: Journal Contribution
Validations: ecoom 2006
Appears in Collections:Research publications

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