Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/22074
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dc.contributor.authorSchwartz, Miriam-
dc.contributor.authorChien Nguyen, Thanh-
dc.contributor.authorThang Vu, Xuan-
dc.contributor.authorWeil, Maryam-
dc.contributor.authorWilhelm, Jannick-
dc.contributor.authorWAGNER, Patrick-
dc.contributor.authorTHOELEN, Ronald-
dc.contributor.authorIngebrandt, Sven-
dc.date.accessioned2016-09-21T12:58:21Z-
dc.date.available2016-09-21T12:58:21Z-
dc.date.issued2016-
dc.identifier.citationPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 213(6), p. 1510-1519-
dc.identifier.issn1862-6300-
dc.identifier.urihttp://hdl.handle.net/1942/22074-
dc.description.abstractSilicon nanowire field-effect transistors (SiNW-FETs) are offering a label-free sensing of DNA molecules based on the detection of the biomolecules' charges. Typically, the charge accumulation at the solid-liquid interface is leading to a change in surface potential of the device. In other works, this effect is usually displayed as change in conductance of the nanowires. In this paper, we show that our topdown processed SiNW-FET devices can be regarded as long-channel, ion-sensitive field-effect transistor devices (ISFETs) and that their electronic characteristics can be fitted by an advanced MOSFET model taking narrow channel effects into account. In DNA experiments, changes in threshold voltage upon immobilization of capture DNA and hybridization with complementary target DNA were recorded as reported before. The signal amplitudes were scaling with different concentrations of electrolyte buffer as known from the commonly used Poisson-Boltzmann theory. In reports from other groups, the sensitivity of SiNW-FETs was reported to be superior compared to ISFETs and scaling effects were observed with smaller wires having higher sensitivities. From our experiments, it seems that the immobilization of the DNA to the wire structure is leading to two effects: firstly, the threshold voltage is changing, leading to a shift in the transistors' transfer characteristics similar to what was described for ISFET devices. In addition, upon DNA binding, a general increase in charge carrier density inside the nanowire is leading to an enhanced conductance. We assume that the latter effect is scaling with nanowire dimensions, while the surface effect is typically constant for all sensor structures.-
dc.description.sponsorshipThis work was done in framework of the project "Nanodrahtsensoren als markerfreie, voll-elektronische Immunosensoren," funded by the BMBF under contract number 17042X11. T. C. N. gratefully acknowledges the financial support by the DAAD. Furthermore, we would like to thank the group of Prof. A. Offenhausser, Peter Grunberg Institute 8, Research Center Julich, Germany, for the fabrication of the SiNW FETs in a former project of our group.-
dc.language.isoen-
dc.publisherWILEY-V C H VERLAG GMBH-
dc.rights© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim-
dc.subject.otherDNA hybridization; field-effect transistors; silicon nanowires; potentiometric detection-
dc.subject.otherDNA hybridization; field-effect transistors; silicon nanowires; potentiometric detection-
dc.titleDNA detection with top-down fabricated silicon nanowire transistor arrays in linear operation regime-
dc.typeJournal Contribution-
dc.identifier.epage1519-
dc.identifier.issue6-
dc.identifier.spage1510-
dc.identifier.volume213-
local.format.pages10-
local.bibliographicCitation.jcatA1-
dc.description.notes[Schwartz, Miriam; Thanh Chien Nguyen; Xuan Thang Vu; Weil, Maryam; Ingebrandt, Sven] Univ Appl Sci Kaiserslautern, Dept Informat & Microsyst Technol, Amerikastr 1, D-66482 Zweibrucken, Germany. [Schwartz, Miriam; Thanh Chien Nguyen; Xuan Thang Vu; Wilhelm, Jannick; Ingebrandt, Sven] Res Dev Ctr, RAM Grp DE GmbH, Amerikastr 1, D-66482 Zweibrucken, Germany. [Xuan Thang Vu] Rhein Westfal TH Aachen, Dept Phys, Sommerfeldstr 14, D-52074 Aachen, Germany. [Wagner, Patrick] Katholieke Univ Leuven, Dept Phys & Astron, Celestijnenlaan 200d, B-3001 Louvain, Belgium. [Wagner, Patrick; Thoelen, Ronald] Hasselt Univ, Inst Mat Res, Agoralaan Bldg D, B-3590 Diepenbeek, Belgium.-
local.publisher.placeWEINHEIM-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.identifier.doi10.1002/pssa.201532919-
dc.identifier.isi000378398900019-
item.validationecoom 2017-
item.accessRightsRestricted Access-
item.fullcitationSchwartz, Miriam; Chien Nguyen, Thanh; Thang Vu, Xuan; Weil, Maryam; Wilhelm, Jannick; WAGNER, Patrick; THOELEN, Ronald & Ingebrandt, Sven (2016) DNA detection with top-down fabricated silicon nanowire transistor arrays in linear operation regime. In: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 213(6), p. 1510-1519.-
item.fulltextWith Fulltext-
item.contributorSchwartz, Miriam-
item.contributorChien Nguyen, Thanh-
item.contributorThang Vu, Xuan-
item.contributorWeil, Maryam-
item.contributorWilhelm, Jannick-
item.contributorWAGNER, Patrick-
item.contributorTHOELEN, Ronald-
item.contributorIngebrandt, Sven-
crisitem.journal.issn1862-6300-
crisitem.journal.eissn1862-6319-
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