Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2318
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dc.contributor.authorMalfait, Milka-
dc.contributor.authorGORDON, Ivan-
dc.contributor.authorMoshchalkov, VV-
dc.contributor.authorBruynseraede, Y-
dc.contributor.authorBorghs, G-
dc.contributor.authorWAGNER, Patrick-
dc.date.accessioned2007-11-13T15:49:50Z-
dc.date.available2007-11-13T15:49:50Z-
dc.date.issued2003-
dc.identifier.citationPHYSICAL REVIEW B, 68(13). p. 132410-...-
dc.identifier.issn1098-0121-
dc.identifier.urihttp://hdl.handle.net/1942/2318-
dc.description.abstractMagnetic and electrical properties of thin epitaxial films of the manganite La1-xCaxMnO3 (xapproximate to0.5) grown by pulsed laser deposition were investigated. The x=0.5 composition corresponds to a half-filled e(g) band and is situated on the border between ferromagnetic-metallic and antiferromagnetic-insulating behavior at low temperatures. Both different types of electrical behaviors are observed in samples with similar deposition parameters. This duality may be attributed to phase separation and the occurrence of percolating paths. The insulating La0.5Ca0.5MnO3 samples become metalliclike when magnetic fields of several tesla are applied. Hereby, resistivity drops up to six orders of magnitude occur at 50 K and 12 T. Hall effect measurements on a sample with spontaneous insulator-metal transition show a sign inversion of the high-field Hall slope around 106 K.-
dc.language.isoen-
dc.publisherAMERICAN PHYSICAL SOC-
dc.titleSign inversion of the high-field Hall slope in epitaxial La0.5Ca0.5MnO3 thin films-
dc.typeJournal Contribution-
dc.identifier.issue13-
dc.identifier.spage132410-
dc.identifier.volume68-
local.format.pages4-
local.bibliographicCitation.jcatA1-
dc.description.notesKatholieke Univ Leuven, Vaste Stof Fys & Magnetisme Lab, B-3001 Heverlee, Belgium. IMEC VZW, B-3001 Heverlee, Belgium. Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium.Malfait, M, Katholieke Univ Leuven, Vaste Stof Fys & Magnetisme Lab, Celestijnenlaan 200D, B-3001 Heverlee, Belgium.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1103/PhysRevB.68.132410-
dc.identifier.isi000186422400018-
item.fulltextNo Fulltext-
item.fullcitationMalfait, Milka; GORDON, Ivan; Moshchalkov, VV; Bruynseraede, Y; Borghs, G & WAGNER, Patrick (2003) Sign inversion of the high-field Hall slope in epitaxial La0.5Ca0.5MnO3 thin films. In: PHYSICAL REVIEW B, 68(13). p. 132410-....-
item.contributorMalfait, Milka-
item.contributorGORDON, Ivan-
item.contributorMoshchalkov, VV-
item.contributorBruynseraede, Y-
item.contributorBorghs, G-
item.contributorWAGNER, Patrick-
item.accessRightsClosed Access-
item.validationecoom 2004-
crisitem.journal.issn1098-0121-
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