Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2329
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dc.contributor.authorVanecek, M-
dc.contributor.authorKravets, R-
dc.contributor.authorPoruba, A-
dc.contributor.authorRosa, J-
dc.contributor.authorNESLADEK, Milos-
dc.contributor.authorKoizumi, S-
dc.date.accessioned2007-11-13T16:01:16Z-
dc.date.available2007-11-13T16:01:16Z-
dc.date.issued2003-
dc.identifier.citationDIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525-
dc.identifier.issn0925-9635-
dc.identifier.urihttp://hdl.handle.net/1942/2329-
dc.description.abstractFourier-transform photocurrent spectroscopy (FrPS) was used as a very sensitive spectroscopic method to detect shallow and deep impurities (dopants) in CVD diamond layers. Detailed study of experimental conditions (temperature, frequency, electric field, bias light, surface conditions) was performed. Residual boron contamination was detected in many samples, phosphorus spectra were measured in P doped epitaxial layers. Anomalous (opposite) temperature dependence of the defect level with a threshold approximately 0.9 eV was detected and possible explanation of this effect was discussed. (C) 2002 Elsevier Science B.V. All rights reserved.-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.subject.otherCVD diamond; doping; defects; photocurrent spectroscopy-
dc.titleFourier transform photocurrent spectroscopy of dopants and defects in CVD diamond-
dc.typeJournal Contribution-
dc.identifier.epage525-
dc.identifier.issue3-7-
dc.identifier.spage521-
dc.identifier.volume12-
local.format.pages5-
local.bibliographicCitation.jcatA1-
dc.description.notesAcad Sci Czech Republ, Inst Phys, CZ-16200 Prague 6, Czech Republic. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium. Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Prague 6, Czech Republic.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/S0925-9635(02)00347-3-
dc.identifier.isi000182872000056-
item.fulltextNo Fulltext-
item.contributorVanecek, M-
item.contributorKravets, R-
item.contributorPoruba, A-
item.contributorRosa, J-
item.contributorNESLADEK, Milos-
item.contributorKoizumi, S-
item.fullcitationVanecek, M; Kravets, R; Poruba, A; Rosa, J; NESLADEK, Milos & Koizumi, S (2003) Fourier transform photocurrent spectroscopy of dopants and defects in CVD diamond. In: DIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525.-
item.accessRightsClosed Access-
item.validationecoom 2004-
crisitem.journal.issn0925-9635-
crisitem.journal.eissn1879-0062-
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