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http://hdl.handle.net/1942/2329
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DC Field | Value | Language |
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dc.contributor.author | Vanecek, M | - |
dc.contributor.author | Kravets, R | - |
dc.contributor.author | Poruba, A | - |
dc.contributor.author | Rosa, J | - |
dc.contributor.author | NESLADEK, Milos | - |
dc.contributor.author | Koizumi, S | - |
dc.date.accessioned | 2007-11-13T16:01:16Z | - |
dc.date.available | 2007-11-13T16:01:16Z | - |
dc.date.issued | 2003 | - |
dc.identifier.citation | DIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525 | - |
dc.identifier.issn | 0925-9635 | - |
dc.identifier.uri | http://hdl.handle.net/1942/2329 | - |
dc.description.abstract | Fourier-transform photocurrent spectroscopy (FrPS) was used as a very sensitive spectroscopic method to detect shallow and deep impurities (dopants) in CVD diamond layers. Detailed study of experimental conditions (temperature, frequency, electric field, bias light, surface conditions) was performed. Residual boron contamination was detected in many samples, phosphorus spectra were measured in P doped epitaxial layers. Anomalous (opposite) temperature dependence of the defect level with a threshold approximately 0.9 eV was detected and possible explanation of this effect was discussed. (C) 2002 Elsevier Science B.V. All rights reserved. | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject.other | CVD diamond; doping; defects; photocurrent spectroscopy | - |
dc.title | Fourier transform photocurrent spectroscopy of dopants and defects in CVD diamond | - |
dc.type | Journal Contribution | - |
dc.identifier.epage | 525 | - |
dc.identifier.issue | 3-7 | - |
dc.identifier.spage | 521 | - |
dc.identifier.volume | 12 | - |
local.format.pages | 5 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Acad Sci Czech Republ, Inst Phys, CZ-16200 Prague 6, Czech Republic. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium. Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Prague 6, Czech Republic. | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
dc.bibliographicCitation.oldjcat | A1 | - |
dc.identifier.doi | 10.1016/S0925-9635(02)00347-3 | - |
dc.identifier.isi | 000182872000056 | - |
item.contributor | Vanecek, M | - |
item.contributor | Kravets, R | - |
item.contributor | Poruba, A | - |
item.contributor | Rosa, J | - |
item.contributor | NESLADEK, Milos | - |
item.contributor | Koizumi, S | - |
item.accessRights | Closed Access | - |
item.fullcitation | Vanecek, M; Kravets, R; Poruba, A; Rosa, J; NESLADEK, Milos & Koizumi, S (2003) Fourier transform photocurrent spectroscopy of dopants and defects in CVD diamond. In: DIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525. | - |
item.fulltext | No Fulltext | - |
item.validation | ecoom 2004 | - |
crisitem.journal.issn | 0925-9635 | - |
crisitem.journal.eissn | 1879-0062 | - |
Appears in Collections: | Research publications |
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