Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2329
Full metadata record
DC FieldValueLanguage
dc.contributor.authorVanecek, M-
dc.contributor.authorKravets, R-
dc.contributor.authorPoruba, A-
dc.contributor.authorRosa, J-
dc.contributor.authorNESLADEK, Milos-
dc.contributor.authorKoizumi, S-
dc.date.accessioned2007-11-13T16:01:16Z-
dc.date.available2007-11-13T16:01:16Z-
dc.date.issued2003-
dc.identifier.citationDIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525-
dc.identifier.issn0925-9635-
dc.identifier.urihttp://hdl.handle.net/1942/2329-
dc.description.abstractFourier-transform photocurrent spectroscopy (FrPS) was used as a very sensitive spectroscopic method to detect shallow and deep impurities (dopants) in CVD diamond layers. Detailed study of experimental conditions (temperature, frequency, electric field, bias light, surface conditions) was performed. Residual boron contamination was detected in many samples, phosphorus spectra were measured in P doped epitaxial layers. Anomalous (opposite) temperature dependence of the defect level with a threshold approximately 0.9 eV was detected and possible explanation of this effect was discussed. (C) 2002 Elsevier Science B.V. All rights reserved.-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE SA-
dc.subject.otherCVD diamond; doping; defects; photocurrent spectroscopy-
dc.titleFourier transform photocurrent spectroscopy of dopants and defects in CVD diamond-
dc.typeJournal Contribution-
dc.identifier.epage525-
dc.identifier.issue3-7-
dc.identifier.spage521-
dc.identifier.volume12-
local.format.pages5-
local.bibliographicCitation.jcatA1-
dc.description.notesAcad Sci Czech Republ, Inst Phys, CZ-16200 Prague 6, Czech Republic. Limburgs Univ Ctr, Mat Res Inst, B-3590 Diepenbeek, Belgium. Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan.Vanecek, M, Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, CZ-16200 Prague 6, Czech Republic.-
local.type.refereedRefereed-
local.type.specifiedArticle-
dc.bibliographicCitation.oldjcatA1-
dc.identifier.doi10.1016/S0925-9635(02)00347-3-
dc.identifier.isi000182872000056-
item.contributorVanecek, M-
item.contributorKravets, R-
item.contributorPoruba, A-
item.contributorRosa, J-
item.contributorNESLADEK, Milos-
item.contributorKoizumi, S-
item.accessRightsClosed Access-
item.fullcitationVanecek, M; Kravets, R; Poruba, A; Rosa, J; NESLADEK, Milos & Koizumi, S (2003) Fourier transform photocurrent spectroscopy of dopants and defects in CVD diamond. In: DIAMOND AND RELATED MATERIALS, 12(3-7). p. 521-525.-
item.fulltextNo Fulltext-
item.validationecoom 2004-
crisitem.journal.issn0925-9635-
crisitem.journal.eissn1879-0062-
Appears in Collections:Research publications
Show simple item record

SCOPUSTM   
Citations

16
checked on Sep 2, 2020

WEB OF SCIENCETM
Citations

17
checked on Apr 22, 2024

Page view(s)

64
checked on Sep 7, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.